Original title: Microstructural Defects of Solar Cells Investigated by a Variety Diagnostics Methods
Authors: Škvarenina, L’ubomír
Document type: Papers
Language: eng
Publisher: Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Abstract: This paper discusses the application of a variety diagnostic methods applicable to the solar cells. More objective results about solar cells quality and reliability are possible to obtain by using a various methods. Diagnostic methods described in this paper are based on a dark and illuminated J–V characteristics, a investigation of noise in a wide range of frequency and a radiation detection at a di erent spectral range, namely by an electroluminescence and a thermography method. These methods are primarily more appropriate for a detection or a localization of microstructure defects when a reverse-bias stress is applied. However, the analysis of a forward-bias conditions is included in an investigation of J–V characteristics as well.
Keywords: Defects; Electroluminescence; J–V curve; Noise; Solar Cells; Thermal Imaging
Host item entry: Proceedings of the 22nd Conference STUDENT EEICT 2016, ISBN 978-80-214-5350-0

Institution: Brno University of Technology (web)
Document availability information: Fulltext is available in the Brno University of Technology Digital Library.
Original record: http://hdl.handle.net/11012/84031

Permalink: http://www.nusl.cz/ntk/nusl-383749


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