Original title: Difúzní rozptyl rentgenového záření na GaN epitaxních vrstvách
Translated title: Diffuse x-ray scattering from GaN epitaxial layers
Authors: Barchuk, Mykhailo ; Holý, Václav (advisor) ; Caha, Ondřej (referee) ; Pietsch, Ulrich (referee)
Document type: Doctoral theses
Year: 2012
Language: eng
Abstract: [eng] [cze]

Keywords: Gallium Nitride; Monte Carlo simulation; stacking faults; threading dislocations; x-ray diffraction; difrakce rtg záření; Gallium Nitrid (GaN); Monte Carlo simulace; threading dislokace; vrstevné chyby

Institution: Charles University Faculties (theses) (web)
Document availability information: Available in the Charles University Digital Repository.
Original record: http://hdl.handle.net/20.500.11956/57327

Permalink: http://www.nusl.cz/ntk/nusl-326594

The record appears in these collections:
Universities and colleges > Public universities > Charles University > Charles University Faculties (theses)
Academic theses (ETDs) > Doctoral theses
 Record created 2017-06-19, last modified 2018-12-08

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