Original title: Studium defektů v gradovaných tenkých vrstvách SiGe/Si pomocí rozptylu rtg.záření
Translated title: X-ray investigation of defects in graded SiGe/Si thin layers
Authors: Endres, Jan ; Daniš, Stanislav (advisor) ; Holý, Václav (referee)
Document type: Master’s theses
Year: 2010
Language: cze
Abstract: [cze] [eng]

Institution: Charles University Faculties (theses) (web)
Document availability information: Available in the Charles University Digital Repository.
Original record: http://hdl.handle.net/20.500.11956/34211

Permalink: http://www.nusl.cz/ntk/nusl-298683

The record appears in these collections:
Universities and colleges > Public universities > Charles University > Charles University Faculties (theses)
Academic theses (ETDs) > Master’s theses
 Record created 2017-05-09, last modified 2017-06-26

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