Název:
Measurements of Residual Reflectivity and Wavelength of Coated Laser Diodes
Autoři:
Růžička, Bohdan ; Lazar, Josef ; Wilfert, O. Typ dokumentu: Příspěvky z konference Konference/Akce: Radioelektronika 2001 /11./, Brno (CZ), 2001-05-10 / 2001-05-11
Rok:
2001
Jazyk:
eng
Abstrakt: This contribution presents experimental results obtained by deposition of double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10 -4 and the repeatibility of the deposition process in a range not exceeding 2x10 -4 .
Klíčová slova:
electron beam vacuum evaporation technique Číslo projektu: CEZ:AV0Z2065902 (CEP), GA101/98/P270 (CEP), IAA2065803 (CEP) Poskytovatel projektu: GA ČR, GA AV ČR Zdrojový dokument: 11th International Czech - Slovak Scientific Conference Radioelektronika 2001 Conference Proceedings, ISBN 80-214-1861-3 Poznámka: Související webová stránka: mailto:ruzicka@isibrno.cz
Instituce: Ústav přístrojové techniky AV ČR
(web)
Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0101005