Original title: Electron probe microanalysis of nonconductive bulk samples
Authors: Jurek, Karel ; Gedeon, O.
Document type: Papers
Conference/Event: EMAS /4./, Třešť (CZ), 2000-05-17 / 2000-05-20
Year: 2000
Language: eng
Abstract: Electron probe x-ray microanalysis of nonconductiv samples can be distorted b electrical field formation under the grounded surface. This posibility is demonstarted by Monte carlo modeling.
Keywords: electric charging; electron probe; x-ray microanalysis
Project no.: CEZ:AV0Z1010914 (CEP)
Host item entry: Electron probe microanalysis today practical aspects, ISBN 80-01-02176-9

Institution: Institute of Physics AS ČR (web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences.
Original record: http://hdl.handle.net/11104/0031432

Permalink: http://www.nusl.cz/ntk/nusl-21841


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Research > Institutes ASCR > Institute of Physics
Conference materials > Papers