Název:
Imaging the local density of electronic states by very low energy electron reflectivity
Autoři:
Pokorná, Zuzana ; Frank, Luděk Typ dokumentu: Příspěvky z konference Konference/Akce: International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation /13./, Skalský dvůr (CZ), 2012-06-25 / 2012-06-29
Rok:
2012
Jazyk:
eng
Abstrakt: This work was concerned with the relationship between the reflectivity of very low energy electrons from a crystalline sample and its density of electron states above the vacuum level. Also, as different crystallographic orientations of the same single crystal exhibit different density of states, the usefulness of electron reflectivity at very low energies was demonstrated for the determination of crystallographic orientation. The technique chosen was the Scanning Low Energy Electron Microscopy (SLEEM) wich allows using arbitrarily low electron energies while preserving a very good image resolution. In our experiments, the incident electron energy ranged between 0 and 45 eV.
Klíčová slova:
crystalography orientation; reflectivity of slow electrons; very low energy scanning electron microscopy Zdrojový dokument: Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation, ISBN 978-80-87441-07-7
Instituce: Ústav přístrojové techniky AV ČR
(web)
Informace o dostupnosti dokumentu:
Dokument je dostupný v příslušném ústavu Akademie věd ČR. Původní záznam: http://hdl.handle.net/11104/0215696