National Repository of Grey Literature 19 records found  1 - 10next  jump to record: Search took 0.01 seconds. 
Electron gun characterisation
Horák, Michal ; Lencová, Bohumila (referee) ; Zlámal, Jakub (advisor)
This thesis deals with problems of electron sources and electron optical systems. The theoretical part covers the derivation of properties of electrostatic and magnetic lenses, their aberrations and programs used for simulations in particle optics. The second part deals with the computation of properties of field emission electron gun.
Design of electron microscope
Havlíček, Petr ; Kobosil, Karel (referee) ; Zvonek, Miroslav (advisor)
The aim of my Master's thesis is the design of a scanning electron microscope. The designed concept presents an innovative approach to the problems and respects all technical, ergonomic and aesthetical demands made on it. The main creative part of design process starting from the concept development and ending up with the final solution is preceded by a background research study including a historical, technical and design analysis of the electron microscope. The conclusion of my Master's thesis analyses the final design, its character and its contribution in broader context.
Design of the Transmission Electron Microscope projection system for the Single Particle Analysis
Bačo, Ondřej ; Tiemeijer, Peter (referee) ; Sháněl, Ondřej (advisor)
Předkládaná práce se zabývá návrhem projektorové soustavy transmisního elektronového mikroskopu (TEM) pro metodu single particle analysis (SPA). Návrh projektorové soustavy byl vytvořen v programu Electron Optical Design (EOD) verze 4.020. Série buzení jednotlivých čoček pro zvětšení projektorové soustavy v rozsahu od 50 do 10000 byla vypočítaná pomocí přístupu využívajícího aproximaci tenké čočky, dále pomocí přístupu využívajícího aproximaci tlusté čočky, metodou linearního zaostření v programu EOD a metodou nelineárního zaostření v programu EOD ve verzi 5.003. Dosažené výsledky byly porovnány a ověřeny pomocí reálného trasování částic v programu EOD.
Design of the Transmission Electron Microscope projection system for the Single Particle Analysis
Bačo, Ondřej ; Tiemeijer, Peter (referee) ; Sháněl, Ondřej (advisor)
Předkládaná práce se zabývá návrhem projektorové soustavy transmisního elektronového mikroskopu (TEM) pro metodu single particle analysis (SPA). Návrh projektorové soustavy byl vytvořen v programu Electron Optical Design (EOD) verze 4.020. Série buzení jednotlivých čoček pro zvětšení projektorové soustavy v rozsahu od 50 do 10000 byla vypočítaná pomocí přístupu využívajícího aproximaci tenké čočky, dále pomocí přístupu využívajícího aproximaci tlusté čočky, metodou linearního zaostření v programu EOD a metodou nelineárního zaostření v programu EOD ve verzi 5.003. Dosažené výsledky byly porovnány a ověřeny pomocí reálného trasování částic v programu EOD.
SMV-2019-64: Circular annular Cs Corrector
Radlička, Tomáš
Feasibity study of Annular circular electrode corrector of the spherical aberration. The effect of the corrector was simulated and results were compared with the standard system with circular aperture.
SMV-2018-21: Calculation of electron optical properties of XPS source
Radlička, Tomáš
Calculation and optimization of the electron optical properties of the electron gun, which is used in the source of X-ray photoemission spectroscope. For the calculation of the space-charge limitted emission was used method developed in the ISI.\n
SMV-2016-21: DA modul for EOD
Radlička, Tomáš
The program library for integrating the differential algebraic method in the EOD program was developed. The set of examples was computed which enables testing of the software.
SMV-2016-20: Simulation of detection systems of scanning electron microscopes
Radlička, Tomáš ; Oral, Martin ; Rozbořil, Jakub
The analysis of the detection system of scanning electron microscopes produced by FEI Czech Republic was done for many setting of the electron optical system. The main goal was to analyze the detection mechanisms and to find optimal system setting for detection of the given part of signal electron spectrum. It is used for maximization of the material or topographical contrast.
Design of electron microscope
Havlíček, Petr ; Kobosil, Karel (referee) ; Zvonek, Miroslav (advisor)
The aim of my Master's thesis is the design of a scanning electron microscope. The designed concept presents an innovative approach to the problems and respects all technical, ergonomic and aesthetical demands made on it. The main creative part of design process starting from the concept development and ending up with the final solution is preceded by a background research study including a historical, technical and design analysis of the electron microscope. The conclusion of my Master's thesis analyses the final design, its character and its contribution in broader context.
Electron gun characterisation
Horák, Michal ; Lencová, Bohumila (referee) ; Zlámal, Jakub (advisor)
This thesis deals with problems of electron sources and electron optical systems. The theoretical part covers the derivation of properties of electrostatic and magnetic lenses, their aberrations and programs used for simulations in particle optics. The second part deals with the computation of properties of field emission electron gun.

National Repository of Grey Literature : 19 records found   1 - 10next  jump to record:
Interested in being notified about new results for this query?
Subscribe to the RSS feed.