National Repository of Grey Literature 3 records found  Search took 0.00 seconds. 
System for computer measurement of transistor characteristics
Krásl, Martin ; Šotner, Roman (referee) ; Brančík, Lubomír (advisor)
This thesis is focused on methods of measuring the characteristics of transistors in three basic connections. There is an example of the characteristic obtained from the simulator for each of the connections. Differential parameters are obtained from the resulting characteristics. These parameters describe a linearized equivalent circuit diagram of the transistor. To automate the process of obtaining characteristics, the next step of this work is the design and construction of the analyzer. The function of individual parts of the hardware is described in detail in the individual chapters. A computer application was created to control the analyzer. This application serves as the user interface. The conclusion of this thesis is a guide for a demonstration laboratory task.
Environmental data collection
Krásl, Martin ; Jaroš, Martin (referee) ; Frýza, Tomáš (advisor)
The thesis focuses on the design of a meteorological station for collecting environmental data that measures non-electrical quantities characterizing environmental conditions. The station is designed to send the collected data to a server for further processing. The design of the station is adapted to low consumption thanks to the possibility of power supply from a photovoltaic panel. The implementation of the station involves the use of an STM32 microprocessor, LTE phone module, Wifi, camera and a set of sensors. Among the selected phenomena monitored by the sensors are measurements of temperature, pressure, wind speed and direction, precipitation, ambient light radiation, UV index, nitrogen oxides, carbon monoxide and dust particles. This thesis also focuses on remote archiving of measured data on the server and providing measured data in the web user interface.
System for computer measurement of transistor characteristics
Krásl, Martin ; Šotner, Roman (referee) ; Brančík, Lubomír (advisor)
This thesis is focused on methods of measuring the characteristics of transistors in three basic connections. There is an example of the characteristic obtained from the simulator for each of the connections. Differential parameters are obtained from the resulting characteristics. These parameters describe a linearized equivalent circuit diagram of the transistor. To automate the process of obtaining characteristics, the next step of this work is the design and construction of the analyzer. The function of individual parts of the hardware is described in detail in the individual chapters. A computer application was created to control the analyzer. This application serves as the user interface. The conclusion of this thesis is a guide for a demonstration laboratory task.

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