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Self-assembled layers based on silicon
Bábík, Adam ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Thin film deposition, characterization and properties of self-assembled monolayers based on silicon were studied with emphasis on the SA monolayers deposited from vinyltriethoxysilane and vinyltrichlorsilane. The thesis is aimed at basic properties of the SA monolayer and explanation of its growth. Methods and techniques used for analysis of the monolayer were described as well. Contact angle measurements and an evaluation of the surface free energy are depicted in details. The deposited SA layers were observed with respect to their chemical composition and surface morphology by X-ray photoelectron spectroscopy (XPS), ellipsometry and atomic force microscopy (AFM).
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Deposition and characterization of SA layers from vinyltriethoxysilane
Veverka, Miroslav ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Development of composite material is very much progressive sector and leads to evolution of material with new property. This type of material has one, but important deficiency. It is small adhesion armature to matrix. My study is sight on improvement adhesion the surface by deposition self assembled (SA) monolayer from organosilanes. Property of this layer, like thickness, surface tension, homogenity and wettability, was evaluated by the contact angle measurement and spektroscopical elipsometri.
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Self-assembled layers based on silicon
Bábík, Adam ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Thin film deposition, characterization and properties of self-assembled monolayers based on silicon were studied with emphasis on the SA monolayers deposited from vinyltriethoxysilane and vinyltrichlorsilane. The thesis is aimed at basic properties of the SA monolayer and explanation of its growth. Methods and techniques used for analysis of the monolayer were described as well. Contact angle measurements and an evaluation of the surface free energy are depicted in details. The deposited SA layers were observed with respect to their chemical composition and surface morphology by X-ray photoelectron spectroscopy (XPS), ellipsometry and atomic force microscopy (AFM).
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Deposition and characterization of SA layers from vinyltriethoxysilane
Veverka, Miroslav ; Veselý, Michal (referee) ; Čech, Vladimír (advisor)
Development of composite material is very much progressive sector and leads to evolution of material with new property. This type of material has one, but important deficiency. It is small adhesion armature to matrix. My study is sight on improvement adhesion the surface by deposition self assembled (SA) monolayer from organosilanes. Property of this layer, like thickness, surface tension, homogenity and wettability, was evaluated by the contact angle measurement and spektroscopical elipsometri.
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