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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record

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