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Scintillation Detector of Secondary Electrons for ESEM
Čudek, Pavel ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for environmental scanning electron microscopy. It describes dilemma of environmental scanning electron microscopy, types of detectors and secondary electrons detection. The experimental part of this thesis focuses on the design and construction of new scintillation detector on the basis of simulations secondary electrons trajectories. Identifying the parameters, pressure dependencies and optimizations of electrode system of the detector realized.
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Multi-electrode system of ionization detector for environmental scanning electrone microscope
Uhlář, Vít ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
Thesis deals with environmental scanning electron microscopy and with detection of signal electrons by using ionization detector. First part talks about the principle of environmental scanning electron microscope. Second part describes signals generated by interaction of primary electron beam with sample. Third section explains the principle of impact ionization and ionization detector. Experimental part deals with usage of segmental ionization detector and with measuring of signal amplification from copper and platinum. Thesis also examines arrangement of electrodes of ionisation detector on material contrast and examines also on influence of voltage contrast on base - emitter junction of an NPN bipolar transistor. All experiments were carried out in dependency on saturated water vapour pressure in sample chamber.
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Multi-electrode system of ionization detector for environmental scanning electrone microscope
Uhlář, Vít ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
Thesis deals with environmental scanning electron microscopy and with detection of signal electrons by using ionization detector. First part talks about the principle of environmental scanning electron microscope. Second part describes signals generated by interaction of primary electron beam with sample. Third section explains the principle of impact ionization and ionization detector. Experimental part deals with usage of segmental ionization detector and with measuring of signal amplification from copper and platinum. Thesis also examines arrangement of electrodes of ionisation detector on material contrast and examines also on influence of voltage contrast on base - emitter junction of an NPN bipolar transistor. All experiments were carried out in dependency on saturated water vapour pressure in sample chamber.
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Multi-electrode system of ionization detector for environmental scanning electrone microscope
Uhlář, Vít ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
Thesis deals with environmental scanning electron microscopy and with detection of signal electrons by using ionization detector. First part talks about the principle of environmental scanning electron microscope. Second part describes signals generated by interaction of primary electron beam with sample. Third section explains the principle of impact ionization and ionization detector. Experimental part deals with usage of segmental ionization detector and with measuring of signal amplification from copper and platinum. Thesis also examines arrangement of electrodes of ionisation detector on material contrast and examines also on influence of voltage contrast on base - emitter junction of an NPN bipolar transistor. All experiments were carried out in dependency on saturated water vapour pressure in sample chamber.
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Scintillation Detector of Secondary Electrons for ESEM
Čudek, Pavel ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
The thesis deals with modifying and biulding of scintilation detector of secondary electrons for environmental scanning electron microscopy. It describes dilemma of environmental scanning electron microscopy, types of detectors and secondary electrons detection. The experimental part of this thesis focuses on the design and construction of new scintillation detector on the basis of simulations secondary electrons trajectories. Identifying the parameters, pressure dependencies and optimizations of electrode system of the detector realized.
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