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Sample preparation and their measurement by EDS methods
Kostelník, Tomáš ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This bachelor´s thesis is focused on preparation and analysis of samples by energy dispersive spectroscopy using scanning electron microscopy. In the theoretical the main differences between environmental scanning electron microscopy and scanning electron microscopy are described. There is also a description of basic knowledge regarding energy dispersive spectroscopy. The generation and detection of signals arising from the interaction of a beam of primary electrons with a sample is also explained, with emphasis on the description, generation and distribution of these signals. The experimental part is focused on sample preparation and analysis.
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Influence of working conditions on results of EDS analysis in environmental SEM
Kaplenko, Oleksii ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
The bachelor thesis contains an operating principle of the environmental scanning electron microscope (ESEM), issue of detection of characteristic X-Ray by using an energy dispersive spectroscopy method. The work describes detection of X-rays through silicon drifted detector, and also the principle of qualitative and quantitative X-ray microanalysis. The aim of this work is to study the influence of working conditions in the scanning electron microscope VEGA3 XMU equipped with Xflash 6 | 10 spectroscope on the results of X-ray microanalysis and their evaluations.
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Analysis of active material for batteries by EDS
Vídeňský, Ondřej ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This master thesis deals with analysis of battery mass using x-ray spectral microanalysis. For the measurement two scanning electron microscopes equipped with energy dispersive x-ray spectroscopes were used. Appropriate examples were prepaired by standard method. Then elemental analysis was performed with changing conditions of measurement. Two programs were used for spectrums evaluation and in the end the size of errors was observed for every conditions.
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Sample preparation and their measurement by EDS methods
Kostelník, Tomáš ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This bachelor´s thesis is focused on preparation and analysis of samples by energy dispersive spectroscopy using scanning electron microscopy. In the theoretical the main differences between environmental scanning electron microscopy and scanning electron microscopy are described. There is also a description of basic knowledge regarding energy dispersive spectroscopy. The generation and detection of signals arising from the interaction of a beam of primary electrons with a sample is also explained, with emphasis on the description, generation and distribution of these signals. The experimental part is focused on sample preparation and analysis.
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Analysis of active material for batteries by EDS
Vídeňský, Ondřej ; Jaššo, Kamil (referee) ; Čudek, Pavel (advisor)
This master thesis deals with analysis of battery mass using x-ray spectral microanalysis. For the measurement two scanning electron microscopes equipped with energy dispersive x-ray spectroscopes were used. Appropriate examples were prepaired by standard method. Then elemental analysis was performed with changing conditions of measurement. Two programs were used for spectrums evaluation and in the end the size of errors was observed for every conditions.
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|
|
Influence of working conditions on results of EDS analysis in environmental SEM
Kaplenko, Oleksii ; Chladil, Ladislav (referee) ; Čudek, Pavel (advisor)
The bachelor thesis contains an operating principle of the environmental scanning electron microscope (ESEM), issue of detection of characteristic X-Ray by using an energy dispersive spectroscopy method. The work describes detection of X-rays through silicon drifted detector, and also the principle of qualitative and quantitative X-ray microanalysis. The aim of this work is to study the influence of working conditions in the scanning electron microscope VEGA3 XMU equipped with Xflash 6 | 10 spectroscope on the results of X-ray microanalysis and their evaluations.
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