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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Basic measurement of dynamic properties of bipolar transistors
 Repčík, Juraj ; Šteffan, Pavel (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor thesis is to analyze theoretical basis of measurement bipolar transistors. First, this project focuses on the static parameters of a bipolar transistor, setting DC voltages and currents in an electric circuit (Q-point, operating point). Second it deals with measurement of selected dynamic properties of amplifier with bipolar transistor. Theoretical knowledge is presented on the practical circuit by a laboratory measurement of the selected properties. The measurement is automated using a computer with LabVIEW software. User programs are developed for measuring the V-A characteristics of a bipolar transistor and for measuring selected dynamic properties of the amplifier. The thesis points out a convenient approach in development of new software for automated measurement using graphical programming in LabVIEW.
Detailed record
Basic measurement of dynamic properties of bipolar transistors
 Repčík, Juraj ; Šteffan, Pavel (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor thesis is to analyze theoretical basis of measurement bipolar transistors. First, this project focuses on the static parameters of a bipolar transistor, setting DC voltages and currents in an electric circuit (Q-point, operating point). Second it deals with measurement of selected dynamic properties of amplifier with bipolar transistor. Theoretical knowledge is presented on the practical circuit by a laboratory measurement of the selected properties. The measurement is automated using a computer with LabVIEW software. User programs are developed for measuring the V-A characteristics of a bipolar transistor and for measuring selected dynamic properties of the amplifier. The thesis points out a convenient approach in development of new software for automated measurement using graphical programming in LabVIEW.
Detailed record

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