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Fixed-charge examination by surface energy measurement
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 and PSG deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System.
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Diagnostics of passivation layers for crystalline silicon solar cellls.
Sládek, Karel ; Hégr, Ondřej (referee) ; Boušek, Jaroslav (advisor)
The work deals with a comparison of existing and perspective types of passivation and anti-reflective coating for silicon solar cells. The theoretical part describes the appropriate methodology for the characterization of these layers and focuses on the passivation layers based on Al2O3. The practical part describes design and verification operations of the equipment for measuring of the amount of fixed charge in the passivation layers using corona discharge. It also describes the implementation of equipment and the results of indicative tests for positive and negative polarity of high voltage. The final part discusses the possibility of equipment improving.
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Fixed-charge examination by surface energy measurement
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This work is deal with development of alternative method measuring fixed charge in thin dielectric layers by surface tension. Presence fixed charge takes effect so-called Back Surface Field (BFS), which helps to decrease surface recombination velocity on back side of solar cell. In work is described experimental measuring on dielectric layers Al2O3, AlN, SiNx, Y2O3 and PSG deposit on crystalline silicon wafers. Surface tension (it is the same like surface free energy) is analyzed from contact angle size using See System.
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Diagnostics of passivation layers for crystalline silicon solar cellls.
Sládek, Karel ; Hégr, Ondřej (referee) ; Boušek, Jaroslav (advisor)
The work deals with a comparison of existing and perspective types of passivation and anti-reflective coating for silicon solar cells. The theoretical part describes the appropriate methodology for the characterization of these layers and focuses on the passivation layers based on Al2O3. The practical part describes design and verification operations of the equipment for measuring of the amount of fixed charge in the passivation layers using corona discharge. It also describes the implementation of equipment and the results of indicative tests for positive and negative polarity of high voltage. The final part discusses the possibility of equipment improving.
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