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Fabrication of SiO2 by anisotropic etching of silicon
Balajka, Jan ; Kolíbal, Miroslav (referee) ; Urbánek, Michal (advisor)
The aim of the bachelor's thesis is the fabrication of silicon dioxide (SiO2) membranes on silicon (Si) substrate by anisotropic etching of silicon. Masks for anisotropic silicon etching were prepared by electron beam litography and SiO2 wet etching. Individual steps of membrane fabrication are described, including used experimental conditions. In order to optimize the fabrication process, etch rates of Si/SiO2 in several solutions were measured. Results of the measurements are included in the thesis. Fabricated membranes were characterised by optical microscopy, scanning electron microscopy and spectroscopic reflectometry. Methods used for fabrication and analysis of defined structures created by anisotropic silicon etching are briefly summarized.
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Fabrication of SiO2 by anisotropic etching of silicon
Balajka, Jan ; Kolíbal, Miroslav (referee) ; Urbánek, Michal (advisor)
The aim of the bachelor's thesis is the fabrication of silicon dioxide (SiO2) membranes on silicon (Si) substrate by anisotropic etching of silicon. Masks for anisotropic silicon etching were prepared by electron beam litography and SiO2 wet etching. Individual steps of membrane fabrication are described, including used experimental conditions. In order to optimize the fabrication process, etch rates of Si/SiO2 in several solutions were measured. Results of the measurements are included in the thesis. Fabricated membranes were characterised by optical microscopy, scanning electron microscopy and spectroscopic reflectometry. Methods used for fabrication and analysis of defined structures created by anisotropic silicon etching are briefly summarized.
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Testing specimens for SEM
Kolařík, Vladimír ; Matějka, Milan ; Urbánek, Michal ; Krátký, Stanislav ; Chlumská, Jana ; Horáček, Miroslav ; Král, Stanislav
Research and development in the field of relief testing structures on Silicon wafer. The specimen is to be used for testing of metrics (dimensions and orthogonality) of scanning electron microscopes (SEM) as well as for the calibration of the SEM view of field. A set of samples is prepared on a Silicon wafer by means of electron-beam lithography and related techniques. The specimens are individually finalized. Related research and development in the field of accuracy assessment and control as well as tolerance measurements in the micron domain; Calibration Certificate.
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