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Characterization of 1-D Nanostructures by SPM Methods
Škoda, David ; Čech, Vladimír (referee) ; Pavlík, Jaroslav (referee) ; Dub, Petr (advisor)
The thesis is aimed at the characterization of carbon nanotubes and silver nanowires by Scanning Probe Microscopy, namely Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Conductive AFM (CAFM) and Scanning Near-Field Optical Microscopy (SNOM). Carbon nanotubes were analyzed by STM, AFM and CAFM microscopy. In a designed apparatus the silver nanowires were fabricated by template assisted deposition and were analyzed with respect to their geometry (AFM), local conductivity (CAFM) and optical properties (SNOM, microreflex spectroscopy). It was found that preferential type of carbon nanowires depends on the fabrication process. The measurements of local conductivity of the nanotubes revealed the similarity with the STM measurements. The AFM measurements of silver nanowires confirmed their growth inside the pores of polycarbonate template. Single nanowires exhibits the semiconducting behavior according to I--V measurement and localized plasmon resonances.
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Measuring parameters of large-area capacitive sensors in touch screens
Baďo, Martin ; Mancl, Vlastimil (referee) ; Beneš, Petr (advisor)
This thesis studies characteristics and technologies used in capacitive sensors. For the purpose of automatic testing of sensors was selected and assembled device LowRider CNC V3. Tested sensors are from materials: silver nanowires and copper electrodes. Device during automatic tests was causing certain level of electromagnetic or electrostatic interference on sensors. Copper electrode sensor responded more significantly to touch but also interference, in comparison with silver nanowires sensor. Results of thesis more closely describe responses by sensors to touch and advantages or disadvantages of automatic testing.
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Characterization of 1-D Nanostructures by SPM Methods
Škoda, David ; Čech, Vladimír (referee) ; Pavlík, Jaroslav (referee) ; Dub, Petr (advisor)
The thesis is aimed at the characterization of carbon nanotubes and silver nanowires by Scanning Probe Microscopy, namely Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Conductive AFM (CAFM) and Scanning Near-Field Optical Microscopy (SNOM). Carbon nanotubes were analyzed by STM, AFM and CAFM microscopy. In a designed apparatus the silver nanowires were fabricated by template assisted deposition and were analyzed with respect to their geometry (AFM), local conductivity (CAFM) and optical properties (SNOM, microreflex spectroscopy). It was found that preferential type of carbon nanowires depends on the fabrication process. The measurements of local conductivity of the nanotubes revealed the similarity with the STM measurements. The AFM measurements of silver nanowires confirmed their growth inside the pores of polycarbonate template. Single nanowires exhibits the semiconducting behavior according to I--V measurement and localized plasmon resonances.
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