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Methodology for determining forgeries and copies of miniature paintings
Sondej, A. ; Hradilová, J. ; Hradil, David
The methodology describes the signs by which it is possible to distinguish between an original miniature portrait painting and other types of imitations, whether they were produced individually or in serial reproduction. For this classification, the methodology uses both routinely available tools (e.g. a magnifying glass or a stereomicroscope) as well as specialized imaging and analytical instruments, without the help of which accurate determination cannot be done. In all cases, these are non-invasive procedures that do not require any material removal from the painting. The analytical procedures used to determine the provenance of a work are in some cases completely new.
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Methodology for determining forgeries and copies of miniature paintings
Sondej, Antonín ; Hradilová, Janka ; Hradil, David
The methodology describes the signs by which it is possible to distinguish between an original miniature portrait painting and other types of imitations, whether they were produced individually or in serial reproduction. For this classification, the methodology uses both routinely available tools (e.g. a magnifying glass or a stereomicroscope) as well as specialized imaging and analytical instruments, without the help of which accurate determination cannot be done. In all cases, these are non-invasive procedures that do not require any material removal from the painting. The analytical procedures used to determine the provenance of a work are in some cases completely new.
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Noninvasive spot analysis of miniatures with portable and laboratory instruments: a methodology for specific use in miniature painting research
Kočí, Eva ; Bezdička, Petr ; Hradil, David ; Garrappa, Silvia ; Hradilová, J. ; Pech, M.
The methodology brings a comprehensive procedure of non-invasive materials analysis of painted miniature artworks, while it is divided into two subsequent parts. In the first part, it describes the use of portable devices for spectroscopic analysis of miniatures, and in the second, it deals with the application of a new methodological procedure for phase/structural materials analysis based on X-ray powder diffraction. The methodology thus includes the following procedures: (i) determination of the elemental composition of the colour layer by the x-ray fluorescence analysis, (ii) identification of binders and other organic compounds using infrared spectroscopy (FT-IR), and finally (iii) phase/mineralogical and structural analysis to describe in more detail the pigments used and processes of their degradation. As part of this last step, the limits of Raman spectroscopy (RS) and the advantages of powder X-ray diffraction and micro-diffraction (XRPD and micro-XRPD) are described, which include greater gentleness to the analysed objects. A very complete and above all non-invasive methodological procedure for the analysis of miniatures is thus offered, which uses the complementarity of individual methods and which can be partly applied already in situ (directly in collection institutions) and partly at specialized workplaces.
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Application of Environmental Scanning Electron Microscopy (ESEM) in the field of miniatures´ analysis: methodology for specific use in miniature painting research
Hradil, David ; Hradilová, J. ; Neděla, Vilém ; Tihlaříková, Eva
The methodology deals with a completely new, unused procedure of non-invasive analysis of painted portrait miniatures, namely an environmental scanning electron microscope with energy-dispersive X-rays. spectrometer(EREM-EDS). EREM, unlike the conventional scanning electron microscope (REM), allows the analysis of ivory painting, which is not possible in a vacuum or low gas pressure environment, where there is a risk of deformation and damagedue to drying of this biological material. The methodology is divided into two parts - the first describes the study of morphological details at high magnification (eg. the possibility of distinguishing different types of biological substrates), the second is the implementation of elemental analysis in high spatial resolution.
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