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Application of Environmental Scanning Electron Microscopy (ESEM) in the field of miniatures´ analysis: methodology for specific use in miniature painting research
Hradil, David ; Hradilová, J. ; Neděla, Vilém ; Tihlaříková, Eva
The methodology deals with a completely new, unused procedure of non-invasive analysis of painted portrait miniatures, namely an environmental scanning electron microscope with energy-dispersive X-rays. spectrometer(EREM-EDS). EREM, unlike the conventional scanning electron microscope (REM), allows the analysis of ivory painting, which is not possible in a vacuum or low gas pressure environment, where there is a risk of deformation and damagedue to drying of this biological material. The methodology is divided into two parts - the first describes the study of morphological details at high magnification (eg. the possibility of distinguishing different types of biological substrates), the second is the implementation of elemental analysis in high spatial resolution.
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SMV-2021-06: EDS analysis of industrial samples
Neděla, Vilém ; Tihlaříková, Eva
The user workshop aimed at handling of the software Esprit 2.2. functioning as a component part of X-Ray EDS analyzer (firm Bruker). The workshop includes the practical demonstrations of elements analyses of samples specially chosen by customer. Further, the workshop is aimed at the basic routines of the morphological analysis of these samples by means of scanning electron microscope.
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