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National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Examination of metals and alloys with slow and very slow electrons
 Mikmeková, Šárka ; Mrňa, Libor ; Mikmeková, Eliška ; Müllerová, Ilona ; Frank, Luděk
In materials science and engineering the scanning low energy electron microscopy (SLEEM) is a technique routinely applied to investigation of advanced materials, which permits us to visualize the initial microstructure of these materials at high spatial resolution and very good sensitivity. However, this technique is only rarely used for examination of conventional materials. Here we present the SLEEM as a fast and simple tool to study also the standard materials.
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Collection contrast in the immersion objective lens of the scanning electron microscope
 Müllerová, Ilona ; Konvalina, Ivo ; Mika, Filip
Signal trajectories of secondary (SE) and backscattered electrons (BSE) were simulated for two cases: an immersion magnetic objective lens (OL) alone and for the case when an electrostatic immersion objective lens is added. Micrographs of a semiconductor structure are presented for these two set-ups.
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