Original title:
Examination of metals and alloys with slow and very slow electrons
Authors:
Mikmeková, Šárka ; Mrňa, Libor ; Mikmeková, Eliška ; Müllerová, Ilona ; Frank, Luděk Document type: Papers Conference/Event: METAL 2012. International Conference on Metallurgy and Materials /21./, Brno (CZ), 2012-05-23 / 2012-05-25
Year:
2012
Language:
eng Abstract:
In materials science and engineering the scanning low energy electron microscopy (SLEEM) is a technique routinely applied to investigation of advanced materials, which permits us to visualize the initial microstructure of these materials at high spatial resolution and very good sensitivity. However, this technique is only rarely used for examination of conventional materials. Here we present the SLEEM as a fast and simple tool to study also the standard materials.
Keywords:
chemical composition analysis; microstructure characterization; residual stress; scanning low energy electron microscopy Project no.: FR-TI3/323 (CEP), ED0017/01/01 Funding provider: GA MPO, GA MŠk Host item entry: METAL 2012 Conference Proceedings. 21st International Conference on Metallurgy and Materials, ISBN 978-80-87294-29-1
Institution: Institute of Scientific Instruments AS ČR
(web)
Document availability information: Fulltext is available at the institute of the Academy of Sciences. Original record: http://hdl.handle.net/11104/0216605