Národní úložiště šedé literatury Nalezeno 2 záznamů.  Hledání trvalo 0.01 vteřin. 
The preparation and characterisation of electrical properties of graphene CVD monocrystals
Hulva, Jan ; Rezek, Bohuslav (oponent) ; Mach, Jindřich (vedoucí práce)
Chemical Vapor Deposition (CVD) of graphene is the method of graphene synthesis capable of producing predominantly single layer graphene of large area. Part of the experimental work of this thesis is focused on the deposition and analysis of single-crystalline graphene domains grown by CVD on a copper foil. These domains are analyzed by the optical microscopy, scanning electron microscopy, atomic force microscopy and Raman spectroscopy. The next part of the work was devoted to iden- tification of defects present on the Cu foil after the deposition of graphene by means of energy dispersive X-ray spectroscopy. The amount of the defects was reduced by the adjustment of the deposition system although not all types of the defects were completely removed. Electronic transport properties of deposited graphene layers were performed in the last part. The results contain measurement of graphene in vacuum with applied back gate voltage and low temperature measurement with applied magnetic field.
The preparation and characterisation of electrical properties of graphene CVD monocrystals
Hulva, Jan ; Rezek, Bohuslav (oponent) ; Mach, Jindřich (vedoucí práce)
Chemical Vapor Deposition (CVD) of graphene is the method of graphene synthesis capable of producing predominantly single layer graphene of large area. Part of the experimental work of this thesis is focused on the deposition and analysis of single-crystalline graphene domains grown by CVD on a copper foil. These domains are analyzed by the optical microscopy, scanning electron microscopy, atomic force microscopy and Raman spectroscopy. The next part of the work was devoted to iden- tification of defects present on the Cu foil after the deposition of graphene by means of energy dispersive X-ray spectroscopy. The amount of the defects was reduced by the adjustment of the deposition system although not all types of the defects were completely removed. Electronic transport properties of deposited graphene layers were performed in the last part. The results contain measurement of graphene in vacuum with applied back gate voltage and low temperature measurement with applied magnetic field.

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