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Preparation and optical properties of scintillation oxide layers
Hanuš, Martin ; Kučera, Miroslav (advisor)
In this work we studied properties of garnet scintillator layers (RxLu3-xAl5O12, RxY3-xAl5O12) doped by rare earth ions (Ce, Pr, Tb), orthosilicates (Y2SiO5; R = Ce, Tb) and influence of Sc codoping on Pr3+ and Tb3+ emissions. The Zr codoping on Ce3+ emission in orthosilicates was also studied. The samples were prepared by liquid phase epitaxy. The studied materials show high quantum efficiency and good chemical and mechanical stability. They represent ideal materials for 2D imaging devices. We studied optical absorption, excitation and emission spectra and scintillation properties (radiolunescence and photoelectron yield). The aim was to determine the properties of grown layers and their comparison to Czochralski grown single crystals. We looked for the impact of melt and growth conditions on measured layer properties. We also tried to determine optimal amount of dopants in layer. We used PbO - B2O3 and BaO - BaF2 - B2O3 fluxes. Using these fluxes, we succeeded in growing layers with less intrinsic defects in crystal lattice in comparison to single crystals. In grown layers of thickness from 1 to 30 µm higher dopant concentration was achieved than in single crystals.
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Study of thin films of molecular nano-magnets prepared by Langmuir-Blodgett technique and drafting of an adapted Langmuir trough
Vaverka, Jan ; Neugebauer, Petr (referee) ; Novák, Jiří (advisor)
This diploma thesis focuses on studies of deposition of molecular nanomagnets doubledecker dysporsium phtalocyanine via Langmuir-Blodgett method. The thesis describes the influence of deposition parameters on structure of deposited molecular layer of doubledecker dysporsium phtalocyanine. The prepared molecular layers are analysed by X-ray reflectivity and Atomic force microscopy. Moreover, the proposal of structural changes of KSV Minimicro instrument, used for Langmuir Blodgett deposition, is described. The intended result is Langmuir trough of bigger dimensions than the recent one, which would enable to distribute molecular layers numbering about magnitude of hundreds.
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Doped DLC coatings for biomedical applications
Písařík, Petr
Nowadays there are materials having excellent properties for use in medicine (Diamond-like carbon, Hydroxyapatite, …). Diamond-like carbon (DLC) is a metastable form of amorphous carbon containing bonded carbon atoms of sp2 and sp3 hybridized orbital. DLC layers are semiconductors with high mechanical hardness, chemical inertness, low coefficient of friction, high thermal conductivity, good electrical and optical properties, biocompatibility and no cytotoxicity. All properties of the films are not always ideal, so it is necessary to modify the layer. One example of how to modify the properties of thin layers are dopations. The incorporation of dopants in films may lead to greater multifunctionality and much improved properties. Most modifications were made to modify contact angle and surface energy, to reduce internal stresses, to decrease surface roughness, coefficient of friction or wear....
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Determination of elastic modulus of thin layer - numerical study of microcompressive test and the bulge test
Petráčková, Klára ; Pokorný, Pavel (referee) ; Náhlík, Luboš (advisor)
Determination of mechanical properties of very thin films is rather difficult task as all of currently using testing techniques have some weakness. This master’s thesis deals with microcompressive test and bulge test. Finite element simulations of the two methods were carried out in order to better understanding of experimental record. Microcompression combines the sample preparation with the use of focused ion beam (FIB) with a compression test carried out using nanoindenter. Cylindrical specimens (pillars) were prepared from Al film deposited on Si substrate using FIB. Experimentally measured data on pillars needs correction to obtain undistorted material properties of Al thin film. A necessary correction using FE modeling is suggested in the thesis. Second part of the work is focused on modeling of bulge test. Pressure is applied on freestanding SiNx film while deflection of the film is measured. Stress state in the film is biaxial making determination of mechanical properties of the film more complicated. The goal is to present how to model the whole problem. In addition, preparation of the specimens was simulated to estimate residual stress in the film. The paper contributes to a better characterization of very thin surface layers and determination of their mechanical properties.
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Study of optoelectrical properties of organic semiconductor thin film layers of phtalocyanines
Miklíková, Zdeňka ; Vala, Martin (referee) ; Zmeškal, Oldřich (advisor)
Diploma thesis is focused on the study of optoelectric properties of thin layers of organic materials based on phthalocyanines, which can be used as an active layer of photovoltaic cells. Especially are studied the properties of the thin active layers of PdPc and PdPc + IL on the glass or ceramic substrates with aluminium contact, which are prepared by material printing here. On the prepared samples were first measured current-voltage characteristics in the dark and in the light and then were measured impedance spectrums in the dark. The received results will be used to improve the properties and structures of photovoltaic cells.
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Study of refractive index dispersion dependences with using of interference microscopy
Schmiedová, Veronika ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The master´s thesis deals with the study of optical properties of thin transparent layers on the organic materials (PPV, P3HT, TiO2, DPP) and especially with the determination of dispersion dependences of refractive index of prepared thin layers. In the theoretical part there are described principles of deposition thin layers of the analyzed materials and their properties. In addition, there are also described methods of optical properties measurements (optical and interference microscopy and ellipsometry). The combination of interference microscope with digital camera was used for determination of refractive index. The image analysis was used for the determination of parameters (with help of the software HarFA). The images of thin layers surfaces were analyzed from the side of the metal contact as well as from the side of glass. In conclusion, there are presented results of the refractive index of the thin layers obtained from the measured values.
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Physical-chemical property characterisation of thin reflective layers on silicon substrates
Rozsívalová, Zdeňka ; Studýnka, Jan (referee) ; Krčma, František (advisor)
This thesis deals with surface analysis and characterization of optical features of thin films created by hexamethyldisiloxane (HMDSO) plasma polymerization on silicon wafers. The RF plasma industrial deposition equipment was used for the thin layers formation. These thin films serve as protective coatings on the reflective layer in the car light or solar panels. Theoretic part gives basic information about plasma, its occurrence, features, diagnostics and applications. Thin layers, their production and characterization are discussed here, too. Theoretic description of monomer material (including the group of other organosilicones) is also presented here. The FTIR spectroscopy and elipsometry are mentioned as the main methods for thin films characterisation. Because material during its practical use degrades due to external conditions, the influence of them on the thin layer properties is studied using the accelerated aging of created films. Industrial deposition chamber AluMet 1800V made by Leybold Optics, Ltd. installed in Zlin Precision company was used for the thin films production. Thin films were created under different conditions that were selelected near to the real conditions used in technology. Various applied powers (2-5 kW) were used for the deposition under different monomer flows. Further, the influence of oxygen addition on the created film properties was investigated. The deposition process was monitored by optical emission spectroscopy. The spectrometer Jobin Yvon Triax 320 with CCD detector was used. The selected part from every samples set was exposed by UV radiation (48 hours at radiation density of 0.68 W/m2 at 340 nm) to simulate the probable conditions during the layers real use. The surface properties were investigated by measurement of reflected light spectral intensity in the visible range at different angles. The angle between incident and reflected beam was varied in the interval of 40 - 150° with 10° step. The influence of sample preparation conditions as well as their aging effect was studied at the selected angles. Spectral reflectance doesn´t depend significantly on applied discharge power and oxygen addition. The significant shift of reflectance into the red part of spectrum was observed at UV exposed samples more or less independently on the applied discharge power of monomer flow rate. Addition of oxygen during the deposition suppresses this effec significantly. Characterization of thin layer structure was done by FTIR spectroscopy. No significant changes were observed in the structure at different discharge powers of monomer flow rates except total absorption intensities that are proportional to the layr thickness. The oxygen addition, of course, changes the structure significantly. These results are only preliminary because the layers were very thin (deposition conditions were near to the common process standard) and thus the signal/noise ratio was relatively low.
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Study of thin film organic materials thickness
Hegerová, Lucie ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
The diploma thesis deals with the determination of thickness and refractive index of thin organic films using image analysis. In the theoretical part there are described principles of the methods, which are used to prepare the films (spin coating, inkjet printing, vapour deposition), the characteristics of thin films, ways of finding out the thickness and refractive index of substances (weight methods, electric methods, method based on measurement of absorption coefficient of light, interference microscopy, ellipsometry) and also image analysis (harmonic and wavelet analysis). Interference microscope Epival - Interpako (Carl Zeiss Jena), digital camera Nikon Coolpix 5400 and computer were used for the determination of thickness and refractive index. The thicknesses of layers were set on the basis of interference images of edges and grooves – both from the side of the metal contact and the side of underlying glass. The refractive indices of thin layers were then set using the recorded figures. In the final part of the thesis there are discussed the results of interference images photographed along the full length of the aluminium contact which are used for measuring electrical characteristics of DPP structures. The produces are thicknesses and refractive indices of individual layers.
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Optical properties of protective emulsions
Valasová, Denisa ; Veselý, Michal (referee) ; Zmeškal, Oldřich (advisor)
This bachelor´s thesis is aimed to the study of optical properties of protective commercially available emulsions. Chosen emulsions should be responsible for sun protection. They also may be used in cosmetic industry. In the beginning of the thesis, there are defined theoretical features of emulsions and their interaction with UV radiation. Methods which are used to describe optical properties could be found in this section too. The optical properties were measured in thin layer films, in order to simulate emulsions applied on the human skin. UV-VIS spectrophotometry was mainly used to study the optical properties. The obtained results could serve, purely hypothetically, like sun protective tests of chosen emulsions.
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Compressive testing of pillars: numerical study
Petráčková, Klára ; Zouhar, Michal (referee) ; Náhlík, Luboš (advisor)
Determination of mechanical properties of thin films, which are used e.g. in electronics, is not simple due to the required very sophisticated equipments. Also the interpretation of results is rather difficult. This bachelor’s thesis is focused on determination of important factors which affect the microcompressive testing results. For microcompressive testing, the pillars made from studied thin film attached by the bottom to a substrate are used. There can be another thin interlayer between studied film and the substrate. The pillar is made by focused ion beam (FIB). Pillar is loaded by a nanoindenter with flat tip while the deformation response is measured. The goal of the thesis is numerical simulation (using the Finite Element Method) of the microcompressive testing and determination of individual specific geometric factors of tested pillars on Young’s modulus of the thin film. Data from microcompressive testing of aluminium thin film attached to silicon substrate with tungsten interlayer were available for numerical simulation. We have estimated influence of specific pillar geometry on data using compressive testing and improved evaluation of Young’s modulus. We have presented a recommendation for more accurate evaluation of Young’s modulus determined from experimental data involving inaccuracy following the pillar shape. The results and methods presented in this thesis can be useful in future development of compressive testing technique for determination of mechanical properties of metal thin films.
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