National Repository of Grey Literature 40 records found  previous11 - 20nextend  jump to record: Search took 0.01 seconds. 
Transport and optical properties of CdTe/CdZnTe single crystals
Uxa, Štěpán ; Belas, Eduard (advisor) ; Humlíček, Josef (referee) ; Drbohlav, Ondřej (referee)
Title: Transport and optical properties of CdTe/CdZnTe single crystals Author: Štěpán Uxa Department: Institute of Physics of Charles University Supervisor: Assoc. Prof. Eduard Belas, PhD, Institute of Physics of Charles University Abstract: The thesis is focused on a study of internal electric field and temperature dependence of the absorption edge of CdTe and CdZnTe samples. In the first part of the thesis the transient-current technique (TCT) is used for investigations of electric fields within planar radiation detectors. The original comprehensive theory that links together TCT measurements with measurements of detector's charge-collection efficiency (CCE) is presented. This approach results in the development of two new iterative methods for processing of experimental data which can be used in any situation when the internal electric field can be approximated by a linear profile. In the second part of the thesis high temperature measurements of transmittance of thin polished CdTe samples are presented, leading to the estimation of the temperature dependence of the bandgap energy from calculated spectra of absorption coefficient. This is for the first time when measurements in a Cd overpressure have been performed which significantly reduces sample sublimation. Keywords: CdTe, transient-current technique,...
Point defects in materials for detection of X-ray and gamma radiation
Rejhon, Martin ; Franc, Jan (advisor) ; Oswald, Jiří (referee) ; Toušek, Jiří (referee)
Title: Point defects in materials for detection of X-ray and gamma radiation Author: Martin Rejhon Department: Institute of Physics of Charles University Supervisor: prof. Ing. Jan Franc, DrSc., Institute of Physics of Charles Uni- versity Abstract: Cadmium telluride and its compounds are suitable materials for pro- duction of X-ray and gamma-ray detectors working at room temperature. How- ever, the detector quality is affected by material imperfections, such as crystal defects and impurities. It results into forming of deep levels which act as re- combination and trapping centers. Then, the accumulated space charge at these deep levels influences electric and spectroscopic properties of the detector. In the end it may result in the polarization effect, when the electric field is localized in vicinity of one contact and detection properties are decreased. This thesis reports a complex study of a detector band structure by various meth- ods with focus on differences between CdTe, CdZnTe, CdTeSe and CdZnTeSe. The electro-optic Pockels effect is used to investigate the influence of the illumi- nation in range 900 − 1800 nm on the inner electric field. The temperature and time evolutions of the electric field after application of bias or switching of the additional light at 940 nm were measured to determine deep levels...
Influence of Deep Levels on Charge Transport in CdTe and CdZnTe
Dědič, Václav
CdTe and CdZnTe are promising materials for room temperature semiconductor X-ray and gamma ray detectors. The accumulation of a space charge at deep energy levels due to a band bending at contacts with Schottky barriers and due to trapped photogenerated charge may result in time dependent change of charge collection efficiency in CdTe and CdZnTe detectors known as polarization effect. This thesis is mainly focused on a study of electric field profiles in detectors under dark and high photon flux conditions simulating detector operation using crossed polarizers technique exploiting the electro-optic (Pockels) effect. It also deals with a study of deep levels responsible for the polarization and influence of contact metals on charge accumulation. Several experimental results are supported by theoretical simulations. The measurements were performed on three sets of samples equipped with different contact metals (Au, In) cut from three different n-type CdTe and CdZnTe materials. Energy levels were detected using methods based on the Pockels effect and discharge current measurements. Detailed study of internal electric field profiles has revealed a fundamental influence of near midgap energy levels related to crystal defects and contact metals on the polarization in semiconductor detectors under high radiation...
Photo-Hall effect spectroscopy and laser-induced transient currents in CdTe-based semiconductor radiation detectors
Musiienko, Artem ; Grill, Roman (advisor)
Title: Photo-Hall effect spectroscopy and laser-induced transient currents in CdTe-based semiconductor radiation detectors Author: Artem Musiienko Department / Institute: Institute of Physics, Faculty of Mathematics and Physics, Charles University Supervisor of the doctoral thesis: Prof. RNDr. Roman Grill, CSc, Institute of Physics, Faculty of Mathematics and Physics, Charles University Abstract: Cadmium Telluride, Cadmium Zinc Telluride, and Cadmium Manganese Telluride are important semiconductors with applications in radiation detection, solar cells, and electro-optic modulators. Their electrical and optical properties are principally controlled by defects forming energy levels within the bandgap. Such defects create recombination and trapping centers capturing photo- created carriers and depreciating the performance of the detector. Simultaneously, the changed occupancy of levels leads to the charging of detector's bulk, which results in the screening of applied bias and the loss of detector's sensitivity. Detailed knowledge of crystal defect structure is thus necessary for the predictable detector work and also for the possibility to reduce the structural defects concentration. This thesis reports on the investigation of deep energy levels in CdTe-based high resistivity and detector-grade materials by...
Influence of external fields on electric field and photocurrent in CdTe detectors
Rejhon, Martin ; Franc, Jan (advisor)
This thesis is focused on a study of CdTe and CdZnTe semiconductor detectors working under high flux of radiation. We studied experimentally an influence of high flux of X-rays and optical radiation on polarization of the detector. The polarization phenomenon decreases the efficiency of the detector due to a screening of an applied electric field by a space charge accumulated at deep levels due to a trapping of photogenerated carriers. In order to measure the electric field profiles in the detectors we employed a method based on cross polarizers technique and Pockels effect. The main objective of this work was to study the possibilities of an optical de-polarization of CdTe and CdZnTe detectors for different photon energies of additional light, its dynamics and physical origin. We have found that detectors can be de-polarized by above bandgap light. Moreover, CdZnTe detector can be depolarized by near infrared light and in a pulse mode. The de- polarization is associated with a compensation of the space charge at deep traps.
Gamma and X- ray CdTe/CdZnTe detectors
Pekárek, Jakub
In the present work we studied an influence of different types of surface etching and surface passivation of high resistivity CdZnTe-based semiconductor detector material. The aim was to find the optimal conditions to improve the properties of metal-semiconductor contact. The main effort was to reduce the leakage current and thus get better X-ray and gamma-ray spectrum, ie to create a detector operating at room temperature based on this semiconductor material with sufficient energy resolution and the maximum charge collection efficiency. Individual surface treatments were characterized by volt-ampere characteristics, spectral analysis and by determination of the profile of the internal electric field.
Recombination centers in semiinsulating CdTe
Zázvorka, Jakub
Title: Recombination centers in semiinsulating CdTe Author: Jakub Zázvorka Department / Institute: Institute of Physics of Charles University Supervisor of the master thesis: prof. Ing. Jan Franc, DrSc., Institute of Physics of Charles University Abstract: The properties of CdTe for application as a radiation detector are influenced through the presence of deep levels in the bang gap. These energy levels complicate the charge collection and the detector efficiency. Contactless resistivity mapping (COREMA) represents a good option for material characterization without the necessity of metal contacts application. The time-dependent charge measurement was investigated on an adjusted apparatus in FMF Freiburg. Theoretical model of charge transport based on band bending on the sample surface was proposed and a non-exponential behavior was calculated. Using this, the resulted parameter tendencies and their connection with deep level trap or recombination center were explained. A correlation was observed between resistivity, photoconductivity and a near midgap level photoluminescence. Parameter profiles were explained using the theory of Fermi level shift relative to the near midgap level. Three deep levels were observed on samples grown at the Charles University in Prague. Their photoluminescence supports the...
Photoluminescence of CdTe crystals
Procházka, Jan
Title: Photoluminescence of CdTe crystals Author: Jan Procházka Department: Institute of Physics of Charles University in Prague Supervisor: Doc. RNDr. Pavel Hlídek, CSc. Abstract: Energy levels connected with defects in nominally undoped crystals CdTe, indium-doped crystals and chlorine-doped crystals were studied using low- temperature photoluminescence. The crystals are intended for X- and gamma- ray detectors operated at room temperature. An effect of annealing in cadmium or tellurium vapor on luminescence spectra was investigated. Some changes were interpreted by filling of vacancies not only by atoms coming from gaseous phase but also by impurities from defects like interstitials, precipitates, inclusions, grain boundaries etc. The luminescence bands assigned to defects important for compensation mechanism were examined, namely A-centers (complexes of vacancy in cadmium sublattice and impurity shallow donor) and complexes of two donors bound to a vacancy. It was shown, that temperature dependence of the luminescence bands results from more complicated processes than a simple thermal escape of bound excitons or thermal excitation of electrons (holes) from defects to bands. We observed expressive "selective pair luminescence" bands (SPL) on partially compensated In-doped samples during sub-gap...
Point defects in materials for detection of X-ray and gamma radiation
Rejhon, Martin ; Franc, Jan (advisor) ; Oswald, Jiří (referee) ; Toušek, Jiří (referee)
Title: Point defects in materials for detection of X-ray and gamma radiation Author: Martin Rejhon Department: Institute of Physics of Charles University Supervisor: prof. Ing. Jan Franc, DrSc., Institute of Physics of Charles Uni- versity Abstract: Cadmium telluride and its compounds are suitable materials for pro- duction of X-ray and gamma-ray detectors working at room temperature. How- ever, the detector quality is affected by material imperfections, such as crystal defects and impurities. It results into forming of deep levels which act as re- combination and trapping centers. Then, the accumulated space charge at these deep levels influences electric and spectroscopic properties of the detector. In the end it may result in the polarization effect, when the electric field is localized in vicinity of one contact and detection properties are decreased. This thesis reports a complex study of a detector band structure by various meth- ods with focus on differences between CdTe, CdZnTe, CdTeSe and CdZnTeSe. The electro-optic Pockels effect is used to investigate the influence of the illumi- nation in range 900 − 1800 nm on the inner electric field. The temperature and time evolutions of the electric field after application of bias or switching of the additional light at 940 nm were measured to determine deep levels...
Investigation of properties of CdTe single-crystals surfaces with sub-nanometer depth resolution
Čermák, Rastislav ; Bábor, Petr (referee) ; Šik, Ondřej (advisor)
V laboratořích Středoevropského technologického institutu – CEITEC je k dispozici unikátní zařízení Qtac, umožňující kvantitativně měřit složení horní atomové vrstvy různých materiálů včetně izolátorů. Qtac k tomu využívá nízkoenergiového rozptylu iontů, tzv. metodu LEIS. Kromě analýzy horní atomové vrstvy je LEIS v Dynamickém módu schopen určit hloubkový profil koncentrace prvku se sub-nanometrovým hloubkovým rozlišením.

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