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Characterization of .beta.-phase in Al-Mg-Si alloys by SLEEM and STLEEM techniques
Ligas, A. ; Hida, S. ; Matsuda, K. ; Mikmeková, Šárka
Knowledge of the distribution and morphology of the Mg2Si precipitates (i.e. .beta.-phase) in Al-Mg-Si alloys are very important for many practical reasons and the scanning electron microscopy (SEM) technique is widely used for their visualization. Unfortunately, in the standard SEM images these precipitates are barely visible and finding them can be very difficult. Using the cathode lens (CL) mode in the SEM (so called SLEEM) these difficulties have been overcome and a very high contrast between the hexagonal-shaped .beta.-phase and the matrix has been obtained. Moreover, it has been found that the SLEEM images offer the possibility to distinguish between the hexagonal-shaped and the conventional .beta.-phase based on their different brightness, not only on their shape, which can be in some cases difficult or even impossible. Mg2Si precipitates have been also characterized by means of the scanning transmission low energy electron microscopy (STLEEM) method based on the using of a STEM detector in the SEM operated in the CL mode.
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Superconductive property and microstructure of MgB2/Al composite materials
Matsuda, K. ; Mizutani, M. ; Nishimura, K. ; Kawabata, T. ; Hishinuma, Y. ; Aoyama, S. ; Müllerová, Ilona ; Frank, Luděk ; Ikeno, S.
Scanning low energy electron microscopy (SLEEM) is a useful tool for observation of insulating samples and determination of microstructure on a specimen surface. In the present work, we have applied the SLEEM to examine the microstructure contrast between boride particles and Al matrix.
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Orientation of Grains in the Al-Mg-Si-Mn Alloy by Scanning Low Energy Electron Microscopy
Müllerová, Ilona ; Matsuda, K. ; Horiba, K. ; Mikmeková, Šárka ; Frank, Luděk
Electron Backscatter Diffraction (EBSD) is a technique allowing the crystallographic infomiation to be obtained from samples in the scanning electron microscope (SEM). The main disadvantages of this method include the specimen tilt by 70°, requiring to operate at large working distances and hence with reduced lateral resolution, and a long acquisition time needed to obtain the full infomnation about grain orientations. However, the crystal orientation can be recognized upon energy dependence of the electron reflectance in the very low energy range. Information can be acquired at a high lateral resolution, high contrast and short acquisition time in a dedicated SEM equipped by the cathode lens.
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