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	Vliv depozičních podmínek na "power factor " (účiník) tenkých termoelektrických vrstev Zeipl, Radek ; Walachová, Jarmila ; Pavelka, Martin ; Jelínek, Miroslav The influence of preparation conditions on the power factor and the dependency of the Seebeck coefficient on conductivity for prepared layers were explored. Layers were prepared by laser ablation from Bi.sub.2./sub.Te.sub.3./sub. target on quartz glass substrates. Thickness of layers changed from 13nm to 400nm, the temperature of the substrate during deposition varied from 300.sup.o./sup.C to 480.sup.o./sup.C and density of energy of laser beam from 2J/cm.sup.2./sup. to 10J/cm.sup.2./sup.. Detailed record
	Preliminary balistic electron emission microscopy/spectroscopy characterization of InAs quantum dots in AlGaAs/GaAs heterostructure Vaniš, Jan ; Henini, M. ; Šroubek, Filip ; Walachová, Jarmila We presented a characterization of InAs self assembled quantum dots embedded in quantum well of the AlGaAs/GaAs heterostructure using ballistic electron emission microscopy/spectroscopy BEEM/BEES. Structures are grown by MBE. Results of spectroscopic measurements "on the dot" and "out of the dot" are also presented. Detailed record
	Annealing of Bi.sub.2./sub.Te.sub.3./sub. thin films prepared by pulsed laser deposition Pavelka, Martin ; Zeipl, Radek ; Jelínek, Miroslav ; Walachová, Jarmila ; Studnička, Václav Bi.sub.2./sub.Te.sub.3./sub. thin films were prepared by laser ablation /PLD/ at room temperature and then annealed in argon atmosphere. Anneling is a widely used method of film properties /primarily crystallinity/ improvement. The influence of annealing on transport properties was studied. Detailed record
	Modification of Bi.sub.2./sub.Te.sub.3./sub. nanolayers Zeipl, Radek ; Pavelka, Martin ; Jelínek, Miroslav ; Vaniš, Jan ; Šroubek, Filip ; Walachová, Jarmila Our Bi.sub.2./sub.Te.sub.3./sub. nanolayers were prepared by laser ablation. If we use different depositon condition, prepared layers will have different properties, exactly with rising temperature of substrate during deposition laeyrs becoming smoother. We present STM picture of 60nm thick Bi.sub.2./sub.Te.sub.3./sub. prepared on substrate with temperature during deposition of 400.sup.0.sup.C. We also present modification of layer after many scans were realized by STM on the same place. Detailed record
	Thickness dependence of transport properties of Bi.sub.2./sub.Te.sub.3./sub. layers Zeipl, Radek ; Lošťák, P. ; Pavelka, Martin ; Žďánský, Karel ; Jelínek, Miroslav ; Walachová, Jarmila The transport properties of layers, prepared by laser ablation, as Hall mobility and conductivity on their thickness at room temperature are presented. This thermoelectric materials is potential candidate for many applications as for thermoelectric devices for power generation, cooling and sensors. Detailed record
	Thickness dependence of transport properties of Bi.sub.2./sub.Te.sub.3./sub. layers Zeipl, Radek ; Lošťák, P. ; Pavelka, Martin ; Žďánský, Karel ; Jelínek, Miroslav ; Walachová, Jarmila The transport properties of layers, prepared by laser ablation, as Hall mobility and conductivity on their thickness at room temperature are presented. This thermoelectric materials is potential candidate for many applications as for thermoelectric devices for power generation, cooling and sensors. Detailed record
	Modification of Bi.sub.2./sub.Te.sub.3./sub. by STM and AFM Vaniš, Jan ; Czajka, R. ; Horák, Jaromír ; Lošťák, P. ; Karamazov, S. ; Walachová, Jarmila Detailed record
	Měření profilu koncentrace/složení na polovodičových nanovrstvách kontaktní metodou. (Measurement of concentration/composition profiles on semiconductor nanostructures with contract mothod) Walachová, Jarmila ; Zelinka, Jiří ; Vaniš, Jan ; Hulicius, Eduard ; Šimeček, Tomáš Detailed record
	Influence of Sample Preparation on Beem Spectroscopic Measurements of Tunnelling In As/Al Sb Double Barrier Heterostructures Walachová, Jarmila Detailed record
	InP gratings for calibration of STM actuators Skalský, Miroslav ; Berková, Daniela ; Rauluszkiewicz, J. ; Aleszkiewicz, P. ; Walachová, Jarmila Detailed record

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