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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Detection of backscattered electrons in the low energy area of the spectra of the electron beam in SEM
 Přichystal, Vladimír
The work focuses especially on research of a detector for conjoint as well as separated detection of backscattered (BSE) and secondary (SE) electrons in a scanning electron microscope in conditions, where the energy of the impacting beam of primary electrons onto a specimen is 1 keV and less. The main goal is a design and realization of a detector for the electron scanning microscope JSM-6700F by the firm JEOL and following measurement of properties of this detector and its influence on the operation of the microscope.
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The possibilities of using FFT for rating the quality of detected signal in ESEM
 Přichystal, Vladimír
The main demand for processing of images from scanning electron microscope is acquirement of the best quality of raster image and description of attributes of micrographs and possibility of their comparison with other micrographs. Therefore software was compiled, which serves to numerical calculation of the Fast Fourier Transform (FFT) of micrographs, evaluation and development of their quality.
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4 Přichystal, Vít
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