|
| |
|
|
Application of correlative AFM/SEM microscopy
Hegrová, Veronika ; Fejfar, Antonín (referee) ; Konečný, Martin (advisor)
This thesis is dealing with application of Correlative Probe and Electron Microscopy. All measurements were carried out by atomic force microscope LiteScope which is designed especially to be combined with electron microscopes. Advantages of Correlative AFM/SEM Microscopy are demonstrated on selected samples from field of nanotechnology and material science. Application of the correlative imaging was proposed and then realized particularly in case of low-dimensional structures and thin films. Further, this thesis deals with the possibility of combining Correlative AFM/SEM Microscopy with other integrated techniques of an electron microscope such as Focused Ion Beam and Energy Dispersive X-rays Spectroscopy.
|
|
| |
|
|
Fabrication and application of graphene-metal heterostructure in biosensing by Surface Enhenced Raman Spectroscopy
Hegrová, Veronika ; Édes, Zoltán (referee) ; Konečný, Martin (advisor)
This thesis deals with fabrication of graphene/metal heterostructures and their application in biosensing by surface-enhanced Raman spectroscopy. The heterostructures are fabricated by selective deposition of gold colloidal nanoparticles onto silicon substrate, where the termination of both the gold colloidal solution and the silicon surface is controlled. Further, the assembled gold colloids are overlaid by graphene monolayer. The experiments have proved, that it is possible to observe the presence of biomolecules at very low concentrations if the parameters of graphene/metal heterostructures are well selected. The combination of both graphene and metal SERS properties have demonstrated their appropriateness for utilization in bisensing.
|
|
| |
|
| |
|
|
Advanced SPM techniques for measuring electrical properties of materials
Kramář, Jan ; Konečný, Martin (referee) ; Pavera, Michal (advisor)
This bachelor thesis is concerned about development of local electric properties characterization technique of sample in contact mode of Atomic Force Microscopy. The research part describes the most expanded techniques of characterization of local electric properties using Scanning Probe Microscopy. For realization was chosen Scanning Spreading Resistance Microscopy. Important part of this technique is current amplifier. For that reason, operational amplifiers, circuits with them and implementation of new amplifier on microscop are described. Last chapter is dedicated to description of samples, which were used to test functionality of the amplifier and technique.
|
|
|
GAP analysis of information security management system
Konečný, Martin ; Tomáš,, Krejčí (referee) ; Sedlák, Petr (advisor)
The master’s thesis focuses on GAP analysis of information security management system. The thesis consists of theoretical, analytical and practical part. The first part discusses the theoretical background of the issue of information and cyber security. The analytical part describes the current condition of the researched company. The thesis’s output is the draft of risk register and draft of security countermeasures implementation. The draft targets on countermeasures leading to increase information security in company.
|
|
|
Information System for Schools
Kupský, Michal ; Konečný, Martin (referee) ; Kříž, Jiří (advisor)
Bachelor's thesis describes the design of an information system for schools. In the first part of my work I will describe the theoretical basis for this work. The following section will focus on present situation analysis, which will present the actual communication styles of schools with children parents. In third part I describe the design of database system, which should simplify and improve awareness of parents on study results and behavior of their children.
|
|
|
Application of KPM on Graphene/Si Surface Modified by FIB method
Konečný, Martin ; Rezek, Bohuslav (referee) ; Bartošík, Miroslav (advisor)
This diploma thesis is focused on the application of Kelvin probe microscopy on graphene fabricated by the chemical vapour deposition. The theoretical part of the thesis deals with basic principles of Kelvin force microscopy and focus ion beam. Further, basic properties of graphene and its possible fabrication methods are discussed. The experimental part is focused on the surface potential measurements on graphene membranes fabricated on the substrate modified by focus ion beam. Finally, atomic force microscope lithography was used for nanopatterning of graphene sheets.
|
guest ::
RSS feed.