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National Repository of Grey Literature 4 records found  Search took 0.01 seconds. 
Study of electrical stress of slot insulations
 Jabůrek, Ladislav ; Rozsívalová, Zdenka (referee) ; Frk, Martin (advisor)
This bachelor works deals with electrical effort problems of dielectric materials. The general aim is study of impact alternating electric field of great effort on slot insulation Nomex-Kapton-Nomex. Measurement of loss is realised by dielectric relaxation spectroscopy in frequency domain method. The another aim is apprise of electrical aeging, its causes and incidence on materials. Works deals below dielectric relaxation spectroscopy in time domain and frequency domain, fundamental effect in dielectric and measurement values coherent with electrical aeging.
Detailed record
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record
Study of electrical stress of slot insulations
 Jabůrek, Ladislav ; Rozsívalová, Zdenka (referee) ; Frk, Martin (advisor)
This bachelor works deals with electrical effort problems of dielectric materials. The general aim is study of impact alternating electric field of great effort on slot insulation Nomex-Kapton-Nomex. Measurement of loss is realised by dielectric relaxation spectroscopy in frequency domain method. The another aim is apprise of electrical aeging, its causes and incidence on materials. Works deals below dielectric relaxation spectroscopy in time domain and frequency domain, fundamental effect in dielectric and measurement values coherent with electrical aeging.
Detailed record
Voltage contrast method at detection of secondary electrons by scintillation detector in VP SEM
 Jabůrek, Ladislav ; Špinka, Jiří (referee) ; Jirák, Josef (advisor)
This thesis deals with scanning electron microscope working at higher pressure in the specimen chamber. The main goal was to study the voltage contrast on the PN junction of the transistor under suitable working conditions for using environmental scanning microscope. The observation of sample was enabled by a scintillation detector designed for observation of high pressure.
Detailed record

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1 Jabůrek, Lukáš
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