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National Repository of Grey Literature 1 records found  Search took 0.00 seconds. 
The optical spectra of carbon-based thin films measured by the photothermal deflection spectroscopy (PDS)
 Remeš, Zdeněk ; Pham, T.T. ; Varga, Marián ; Kromka, Alexander ; Stuchlík, Jiří ; Mao, H.B.
Our photothermal deflection spectroscopy (PDS) setup allows to measure simultaneously the absolute values of the optical transmittance T, reflectance R and absorptance A spectra of thin layers on glass substrates in the spectral range from ultraviolet to near infrared light with the typical spectral resolution 5 nm in the ultraviolet, 10 nm in visible and 20 nm in the near infrared region. The PDS setup provides the dynamic detection range in the optical absorptance up to 4 orders of magnitude. Here we demonstrate the usability of this setup by comparing the optical absorbance on a series of the carbon layer and nanocrystalline diamond (NCD) thin layers deposited on glass substrates by using the magnetron sputtering and the microwave based surface wave discharge in linear antenna chemical vapor deposition (CVD) processes, respectively. The defect-induced localized states in the energy gap are observed in all carbon layers as well as in NCD.
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