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Analysis of Defects on PCB Using Modern Optical Method
Vala, Martin ; Řezníček, Michal (referee) ; Řihák, Pavel (advisor)
This diploma thesis is focused on detecting of defects on BGA (Ball Grid Array) components using of X-ray. Defects are formed during reflow BGA components during assembly, but also later due to mechanical and thermal stress. Therefore, there is an overview of defects and methods of diagnosis of BGA packages eg .: modern X-ray defect detection or micro sections. There is disclosed a device NORDSON DAGE XD7600NT its operation and setup. The device enables advanced methods of scanning called X-plane. For creating 3D models used reconstructive software called CERA, which uses raw data from the method of X-Plane.
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Analysis of Defects on PCB Using X-RAY
Mlýnek, Martin ; Vala, Radek (referee) ; Řihák, Pavel (advisor)
This thesis is focused on BGA packages and fault detection after rework using X – Ray. There is a description of BGA packages by carrier substrate, techniques of connecting on chip, from mounting packages to repair printed circuit boards (hereafter PCB). Thesis summarizes description of defects, which are created after rework process. There is also description of X – Ray as method for analyzing defects. X – PLANE method used to detect internal structure of BGA packages and it was confirmed by microsection and by software for reconstruction. Description of automatic and manual measurement is follow.
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Delayering of semiconductor chips
Valachovič, Marek ; Adámek, Martin (referee) ; Búran, Martin (advisor)
This work describes the individual layers of whitch the semiconductor chip is composed, the types of packages in witch it can be encapsulated and the methods of connecting the chip with the package. Furthermore, the methods of dacapsulating the encapsulated chip and delayering using several different methods, such as mechanical, chemical, plasmatic, or using an focused ion beam, are describe here. The methods of mechanical and chemical delayering of the layers of the semiconductor chip togeaher with dalayering by focused ion beam with the help of gas are practically performed and recorded.
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Analysis of Defects on PCB Using Modern Optical Method
Vala, Martin ; Řezníček, Michal (referee) ; Řihák, Pavel (advisor)
This diploma thesis is focused on detecting of defects on BGA (Ball Grid Array) components using of X-ray. Defects are formed during reflow BGA components during assembly, but also later due to mechanical and thermal stress. Therefore, there is an overview of defects and methods of diagnosis of BGA packages eg .: modern X-ray defect detection or micro sections. There is disclosed a device NORDSON DAGE XD7600NT its operation and setup. The device enables advanced methods of scanning called X-plane. For creating 3D models used reconstructive software called CERA, which uses raw data from the method of X-Plane.
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Analysis of Defects on PCB Using X-RAY
Mlýnek, Martin ; Vala, Radek (referee) ; Řihák, Pavel (advisor)
This thesis is focused on BGA packages and fault detection after rework using X – Ray. There is a description of BGA packages by carrier substrate, techniques of connecting on chip, from mounting packages to repair printed circuit boards (hereafter PCB). Thesis summarizes description of defects, which are created after rework process. There is also description of X – Ray as method for analyzing defects. X – PLANE method used to detect internal structure of BGA packages and it was confirmed by microsection and by software for reconstruction. Description of automatic and manual measurement is follow.
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