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Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution
Zemek, Marek ; Chmelík, Jiří (oponent) ; Mézl, Martin (vedoucí práce)
Computed tomography is a tool for nondestructive evaluation of samples, commonly used in many industrial and scientific fields. Some tomographic devices produce images with sub-micrometer spatial resolution. The field of view of such devices can be very small, in the range of single millimeters or less. This restricts possible sizes of samples, which is a major limitation. Various field-of-view extension techniques exist which are able to overcome this restriction. In this thesis, a previously published technique was adapted and implemented specifically for the Rigaku Nano3DX X-Ray microscope. This technique almost doubles the lateral extent of the field of view without the need for a larger detector array. The approach was tested using both synthetic and real data, and its performance is evaluated subjectively and objectively, through visual inspection and image quality metrics. The evaluation is largely based on comparing images reconstructed using this method to ones acquired using a larger detector array. The field-of-view extension method yields faithful reconstructions of samples, comparable in quality to their larger-detector counterparts.
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Method For Extending The Field Of View For X-Ray Computed Tomography With Submicron Resolution
Zemek, Marek
Computed tomography allows for nondestructive evaluation of samples. It is commonly used for many industrial and scientific applications. Some devices are capable of submicron resolutions, but this often comes at the cost of a limited field of view. Techniques that extend the field of view can greatly enhance the versatility of these scanners. One such technique is presented here. It is implemented on the Rigaku Nano3DX, almost doubling its lateral field of view. The method utilizes a standard reconstruction algorithm, and yields faithful reconstructions of scanned samples without the need for a larger detector.
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Method for Extending the Field of View for X-ray Computed Tomography with Submicron Resolution
Zemek, Marek ; Chmelík, Jiří (oponent) ; Mézl, Martin (vedoucí práce)
Computed tomography is a tool for nondestructive evaluation of samples, commonly used in many industrial and scientific fields. Some tomographic devices produce images with sub-micrometer spatial resolution. The field of view of such devices can be very small, in the range of single millimeters or less. This restricts possible sizes of samples, which is a major limitation. Various field-of-view extension techniques exist which are able to overcome this restriction. In this thesis, a previously published technique was adapted and implemented specifically for the Rigaku Nano3DX X-Ray microscope. This technique almost doubles the lateral extent of the field of view without the need for a larger detector array. The approach was tested using both synthetic and real data, and its performance is evaluated subjectively and objectively, through visual inspection and image quality metrics. The evaluation is largely based on comparing images reconstructed using this method to ones acquired using a larger detector array. The field-of-view extension method yields faithful reconstructions of samples, comparable in quality to their larger-detector counterparts.
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