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The TCR measurement of thick-film layers
Polášek, David ; Psota, Boleslav (referee) ; Adámek, Martin (advisor)
The work focuses on measurement methods of temperature coefficient of resistance of thick-filmed paste in thick-film technology, which is one of basic mikroelectronic technologies. Layer technologies are described in the beginning of the essay, where I focus on production of my own layers. The temperature coefficient of resistance, its calculation, design of sample for measurement, procedure of measurement and testing of measuring temperature coefficient of resistance are mentioned in the following part of the essay.

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2 Polášek, Daniel
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