|
|
Assembling and testing of low temperature STM microscope
Sojka, Antonín ; Páleníček, Michal (referee) ; Pavera, Michal (advisor)
This bachelor thesis addresses the problem of assebling the low temperature STM working in ultrahigh vacuum. The thesis deals with connecting the microscope and electronics. The desing of temperature stabilizers for fixing the low temperatures is described along with a construction of expanding the vacuum chamber to test STM in low temperatures. The thesis describes the construction of sample and tip holders to insert samples and tips into the STM. At the end there are brief instructions to use GXSM software and testing the microscope in atmospheric pressure.
|
|
|
Upgrade of the device for depositions by ion beam sputtering
Páleníček, Michal ; Mach, Jindřich (referee) ; Bábor, Petr (advisor)
This thesis deals with concept and realization of device which allows loading without air intake. Vacuum technology and its theoretical bases are discussed as well. Moreover the thesis is based on description of the current deposition chamber and its principles. The main part deals with the description of the concepts of lock and load systems. The first concept that has not been realized is described just briefly. The second one is thorough with description of the individual solutions and methods. The work also contains simple instructions how to install the specimen. At the end are described some outputs of simulations that have been done to comprehend and solve any problems that might occur as specimen holder cooling and deflection of magnetic rod.
|
|
|
Adaptation of the UHV SEM system for growth and characterization of nanostructures
Skladaný, Roman ; Mach, Jindřich (referee) ; Páleníček, Michal (advisor)
This bachelor thesis presents mechanical design of an objective protection of ultrahigh vacuum scanning electron microscope (UHV SEM), which is a part of a complex modular UHV system used for growth, observation and characterisation of nanostructures. Main physical and technical working principles of the UHV SEM system are explained. Furthermore, adaptation of a Knudsen cell used for growth of ultrathin layers in the UHV SEM system is described. Finally, a mechanical design of a shutter reducing overheating and contamination of objective during in situ growth and observation of nanostructures is drafted. The objective shutter also protects the sample from ambient heat radiation in case that sample is cooled to cryogenic temperatures.
|
|
| |
|
|
MeV ion irradiation beamline at the Uppsala Tandem Accelerator: Improvements and applications
Sekula, Filip ; Páleníček, Michal (referee) ; Průša, Stanislav (advisor)
V této práci je představeno zařízení pro ozařování MeV ionty při tandemovém urychlovači na univerzitě v Uppsale. Jsou podány základy teorie interakce iontů s pevnou látkou a modifikace materiálu pomocí iontů s vysokou energií. Zařízení tandemového urychlovače je popsáno počínaje generací iontů a konče dopadem iontů na vzorek v hlavní komoře zařízení pro iontové ozařování. Následně jsou detailně charakterizovány modifikace systému pro přesun vzorků a popsán princip jeho funkce. Pilotní aplikace upraveného systému v oblasti materiálových modifikací je prezentována na příkladu ozařování Ge kvantových teček. Homogenita rozložení iontů na vzorku při ozařování je testována pomocí simulace elektrostatického deflektoru.
|
|
|
Temperature drift compensation for nanostructure analysis
Hakira, Stanli ; Páleníček, Michal (referee) ; Bábor, Petr (advisor)
An ultra high vacuum apparatus for nanostructure experiments is being developed by the Tescan company in cooperation with the Institute of Physical Engineering of the Faculty of Mechanical Engineering. The apparatus is designed for preparation, modification, and analysis of nano-scale structures. A sample holder which allows heating and cooling has been developed for the apparatus. A scanning electron microscope is attached to the chamber to provide analytical and manufacturing capabilities. During experiments with heating enabled, the sample moves relative to the SEM column, causing drift of the image. This bachelor thesis proposes a solution to the problem of temperature drift by the means of motion tracking based on image registration using Fourier transform. An application complementary to the SEM control software which implements the algorithm was designed and tested at the instrument.
|
|
|
Detection and analysis of crystal defects in Si wafer for electronics
Páleníček, Michal ; Tichopádek, Petr (referee) ; Urbánek, Michal (advisor)
The thesis deals with the study and analysis of crystallographic defects on the surface of silicon wafers produced by Czochralski method. It focuses primarily on growth defects and oxygen precipitates, which play an important role in the development of appropriate nucleation centers for growth of stacking faults. The growth of stacking faults near the surface of silicon wafers is supported by their oxidation and selective etching. Such a highlighted stacking faults are known as the OISF (Oxidation Induced Stacking Fault). Spatial distribution of OISF on the wafer gives feedback to the process of pulling silicon single crystal and wafers surface quality. Moreover the work describes the device for automatic detection and analysis of OISF, which was developed for ON Semiconductor company in Rožnov Radhoštěm.
|
|
| |
|
|
MeV ion irradiation beamline at the Uppsala Tandem Accelerator: Improvements and applications
Sekula, Filip ; Páleníček, Michal (referee) ; Průša, Stanislav (advisor)
V této práci je představeno zařízení pro ozařování MeV ionty při tandemovém urychlovači na univerzitě v Uppsale. Jsou podány základy teorie interakce iontů s pevnou látkou a modifikace materiálu pomocí iontů s vysokou energií. Zařízení tandemového urychlovače je popsáno počínaje generací iontů a konče dopadem iontů na vzorek v hlavní komoře zařízení pro iontové ozařování. Následně jsou detailně charakterizovány modifikace systému pro přesun vzorků a popsán princip jeho funkce. Pilotní aplikace upraveného systému v oblasti materiálových modifikací je prezentována na příkladu ozařování Ge kvantových teček. Homogenita rozložení iontů na vzorku při ozařování je testována pomocí simulace elektrostatického deflektoru.
|
|
|
Temperature drift compensation for nanostructure analysis
Hakira, Stanli ; Páleníček, Michal (referee) ; Bábor, Petr (advisor)
An ultra high vacuum apparatus for nanostructure experiments is being developed by the Tescan company in cooperation with the Institute of Physical Engineering of the Faculty of Mechanical Engineering. The apparatus is designed for preparation, modification, and analysis of nano-scale structures. A sample holder which allows heating and cooling has been developed for the apparatus. A scanning electron microscope is attached to the chamber to provide analytical and manufacturing capabilities. During experiments with heating enabled, the sample moves relative to the SEM column, causing drift of the image. This bachelor thesis proposes a solution to the problem of temperature drift by the means of motion tracking based on image registration using Fourier transform. An application complementary to the SEM control software which implements the algorithm was designed and tested at the instrument.
|
guest ::
