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National Repository of Grey Literature 3 records found  Search took 0.00 seconds. 
Contrast enhancement of nanostructures imaging in STM by a direct profile derivative measurement using lock-in technique
 Keresteš, Jiří ; Sobotík, Pavel (advisor) ; Dvořák, Filip (referee)
The thesis aims to study a method of direct profile derivative measurement along the line (dz/dx) by a scanning tunneling microscope (STM) using the lock-in technique. A commercial lock-in amplifier module FEMTO has been equipped with support circuit and installed into the current STM system. Its functionality was tested by measuring on a clean Si(100)-2×1 surface and on the same surface with deposited In-Sn chains. The data acquired from the derivative measurement were compared with the profile measurement data. Powered by TCPDF (www.tcpdf.org)
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Morphology of model catalysts in electrolyte environment
 Keresteš, Jiří ; Mysliveček, Josef (advisor) ; Bystroň, Tomáš (referee)
The aim of this thesis is preparation of inverse model catalyst CeOx/Pt(111) and its investigation using combination of surface physics methods and electrochemistry. New electrochemical cell was designed and built for electrochemical experiments. CeOx/Pt(111) samples were prepared and studied in UHV using STM and XPS methods. After that, samples were transferred to the electrolyte environment and studied by means of cyclic voltammetry and AFM. For high surface coverage of CeOx, new reaction was observed. We have identified this reaction as a combination of the reduction of cerium(IV) oxide by interaction with hydrogen adsorbed on the Pt(111) surface and oxidation of cerium(III) oxide by dissociative adsorption of water molecules. Powered by TCPDF (www.tcpdf.org)
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Contrast enhancement of nanostructures imaging in STM by a direct profile derivative measurement using lock-in technique
 Keresteš, Jiří ; Sobotík, Pavel (advisor) ; Dvořák, Filip (referee)
The thesis aims to study a method of direct profile derivative measurement along the line (dz/dx) by a scanning tunneling microscope (STM) using the lock-in technique. A commercial lock-in amplifier module FEMTO has been equipped with support circuit and installed into the current STM system. Its functionality was tested by measuring on a clean Si(100)-2×1 surface and on the same surface with deposited In-Sn chains. The data acquired from the derivative measurement were compared with the profile measurement data. Powered by TCPDF (www.tcpdf.org)
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