National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Height profile measurement by means of white-light interferometry
Pavlíček, Pavel
White-light interferometer measures the heigh profile of smooth as well of rough surfaces, this feature renders it suitable for the technical practice.
Height profile measurement by means of white-light interferometry
Pavlíček, Pavel
White-light interferometry is an established method for the height-profile measurement of rough surface. we show the results of the heigh-profile measurement of silicon waters.

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