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Measurement of graphene transport properties
Nečesal, Daniel ; Procházka, Pavel (referee) ; Kormoš, Lukáš (advisor)
In order to create electronic devices utilizing graphene, it is necessary to manu- facture large sheets of high quality graphene which can be achieved by chemical vapor deposition (CVD). Mobility plays an important role in determining quality of graphene sheet because it is inversely proportional to concentration of defects. In this work, CVD graphene samples were fabricated, and their transport properties were characterized by van der Pauw and Hall bar methods. Graphene was transferred to samples either by using Fe(NO3)3 solution or via electrolytic delamination process. Both methods yiel- ded highly p-doped graphene. The electrolytic delamination transfer process resulted in a higher mobility of the graphene sheet and the Dirac point was observed due to a significant doping decrease.
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Measurement of graphene transport properties
Nečesal, Daniel ; Procházka, Pavel (referee) ; Kormoš, Lukáš (advisor)
In order to create electronic devices utilizing graphene, it is necessary to manu- facture large sheets of high quality graphene which can be achieved by chemical vapor deposition (CVD). Mobility plays an important role in determining quality of graphene sheet because it is inversely proportional to concentration of defects. In this work, CVD graphene samples were fabricated, and their transport properties were characterized by van der Pauw and Hall bar methods. Graphene was transferred to samples either by using Fe(NO3)3 solution or via electrolytic delamination process. Both methods yiel- ded highly p-doped graphene. The electrolytic delamination transfer process resulted in a higher mobility of the graphene sheet and the Dirac point was observed due to a significant doping decrease.
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Characterization of the Nanostructured Nickel Oxide Layers Prepared by Ion Beam Sputtering
Horák, Pavel ; Bejšovec, Václav ; Lavrentiev, Vasyl ; Khun, J. ; Vrňata, M.
Nanostructured nickel oxide layers (thickness cca 100 nm) were prepared by bombardment of nickel foil with ion beam created from a mixture of argon and oxygen. Different volume ratios of argon:oxygen mixture were used, ranging from 4:1 to 1:3. Composition of the resulting layers was analyzed by RBS, morphology by AFM and main crystal orientation of the sample by XRD. The electrophysical properties (resistivity, concentration of charge carriers) were measured by four point Van der Pauw technique and Hall measurement respectively. Prepared samples were characterized in as-deposited state and after annealing with varying temperature of treatment. Chemical composition (i.e. stoichiometry) of the as-deposited samples with different argon: oxygen ratio was related to their electrophysical parameters. Hall measurements are showing majority charge carriers to be electrons - surface concentration (0.5 - 2.3) x 10(21) m(-2) - suggesting prevailing metallic conductivity. Resistivity of the sample is increasing with higher amount of oxygen in gas mixture. The as-deposited layer is almost amorphous with no visible grains on AFM.
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