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Measurement of the Optical Trap Stiffness
 Jákl, Petr ; Jonáš, Alexandr ; Zemánek, Pavel ; Liška, M.
An optical trap for dielectric microparticles is usually approximated by a parabolic potential well, whose profile is characterized by a single constant - trap stiffness. This stiffness can be estimated using several methods, including Fourier spectral analysis of the thermal noise of the trapped particle position, or method based on equipartition theorem. The principles of the trap calibration and experimental results are presented.
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