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Progressive Amorphous Carbon Alloys Synthesized in Low-Temperature Plasma
Bránecký, Martin ; Trunec, David (referee) ; Kylián,, Ondřej (referee) ; Čech, Vladimír (advisor)
Atomic/plasma polymerization technology is widely used in various technical fields. This work is focused to use the PE-CVD technology in the field of formation of interphase and adhesive layers, which are developed into layered nanostructures. To ensure reproducible chemical and physical properties of the materials, the deposition process was monitored by mass spectrometry. Vapours of the pure tetravinylsilane, or a mixture of these vapours with oxygen, was used as a precursor for atomic polymerization, which results in the thin films with a large variability of properties. Physical and chemical properties were varied by the effective power delivered to the plasma discharge. The deposited films were analyzed from different perspectives using several methods (in situ spectroscopic ellipsometry, FTIR, nanoindentation, AFM). The removal of hydrogen atoms from the carbon-silicon network results in increased crosslinking of the material, which controls the mechanical and optical properties of the deposited layers. From the precisely defined a-CSi:H and a-CSiO:H materials, layered nanostructures composed of 3 and 7 individual layers was subsequently constructed. These nanostructures were analyzed by XPS and RBS to determine the atomic concentrations of carbon, silicon, oxygen and their binding states.
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Functional organic-inorganic nanostructures
Kelíšek, Petr ; Zmeškal, Oldřich (referee) ; Čech, Vladimír (advisor)
Diploma thesis deals with preparation of multilayered organic-inorganic nanostructures via PECVD technology and analysis of optical properties of these layers by spectroscopic ellipsometry. The theoretical part handles the definition of thin layers, layered and gradient nanostructures, plasma enhanced chemical vapor deposition and principles of spectroscopic ellipsometry. In the experimental part, used materials and chemicals are described, afterwards follow a complete description of the apparatus used for sample preparation and a description of the sample preparation procedure. The results part consists of methodology of preparing material models necessary for ellipsometric measurements and evaluation of optical properties of deposited nanolayers.
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Progressive Amorphous Carbon Alloys Synthesized in Low-Temperature Plasma
Bránecký, Martin ; Trunec, David (referee) ; Kylián,, Ondřej (referee) ; Čech, Vladimír (advisor)
Atomic/plasma polymerization technology is widely used in various technical fields. This work is focused to use the PE-CVD technology in the field of formation of interphase and adhesive layers, which are developed into layered nanostructures. To ensure reproducible chemical and physical properties of the materials, the deposition process was monitored by mass spectrometry. Vapours of the pure tetravinylsilane, or a mixture of these vapours with oxygen, was used as a precursor for atomic polymerization, which results in the thin films with a large variability of properties. Physical and chemical properties were varied by the effective power delivered to the plasma discharge. The deposited films were analyzed from different perspectives using several methods (in situ spectroscopic ellipsometry, FTIR, nanoindentation, AFM). The removal of hydrogen atoms from the carbon-silicon network results in increased crosslinking of the material, which controls the mechanical and optical properties of the deposited layers. From the precisely defined a-CSi:H and a-CSiO:H materials, layered nanostructures composed of 3 and 7 individual layers was subsequently constructed. These nanostructures were analyzed by XPS and RBS to determine the atomic concentrations of carbon, silicon, oxygen and their binding states.
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Functional organic-inorganic nanostructures
Kelíšek, Petr ; Zmeškal, Oldřich (referee) ; Čech, Vladimír (advisor)
Diploma thesis deals with preparation of multilayered organic-inorganic nanostructures via PECVD technology and analysis of optical properties of these layers by spectroscopic ellipsometry. The theoretical part handles the definition of thin layers, layered and gradient nanostructures, plasma enhanced chemical vapor deposition and principles of spectroscopic ellipsometry. In the experimental part, used materials and chemicals are described, afterwards follow a complete description of the apparatus used for sample preparation and a description of the sample preparation procedure. The results part consists of methodology of preparing material models necessary for ellipsometric measurements and evaluation of optical properties of deposited nanolayers.
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