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The Use of AFM Measurement Method in Crystalline Silicon Solar Cells Technology
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This thesis deals with the use of Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KPFM) in solar cells production. Both techniques measure surface properties using interactions between surface and tip that progressively scans entire surface of the sample. Atomic force microscopy allows three dimensional imaging of surface structure. Kelvin probe force microscopy is used to measure the contact potential difference on the sample surface. There are described experimental measurements of monocrystalline and multicrystalline substrates after various etching processes using AFM. By using KPFM the contact potential difference was measured on dielectric layers PSG, SiOX, SiNX and Al2O3 and on selective emitter structures. All experiments described in this work were carried out at the Solartec Ltd. workplace and they completely correspond with the actual technology of crystalline solar cells production.
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Local flood early warning system
Svoboda, Luděk ; Špaček, Jiří (referee) ; Růžek, Václav (advisor)
The aim of this Master's thesis is to design a local flood warning system. The system consists of two basic types of units. The first unit is placed in the field usingsensors and evaluates the presence of water in an otherwise dry area. In the event of flooding sends a warning message using wireless technology. The second unit evaluates the warning messages and informs the personabout the situation via text messaging. Outdoor equipment is fullyautonomous and permanently placed in an outdoor environment. The system is designed based 8-bit microcontrollers. The main parametersinclude low power devices, mechanical durability and reliability.
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The Use of AFM Measurement Method in Crystalline Silicon Solar Cells Technology
Mojrová, Barbora ; Boušek, Jaroslav (referee) ; Hégr, Ondřej (advisor)
This thesis deals with the use of Atomic Force Microscopy (AFM) and Kelvin Probe Force Microscopy (KPFM) in solar cells production. Both techniques measure surface properties using interactions between surface and tip that progressively scans entire surface of the sample. Atomic force microscopy allows three dimensional imaging of surface structure. Kelvin probe force microscopy is used to measure the contact potential difference on the sample surface. There are described experimental measurements of monocrystalline and multicrystalline substrates after various etching processes using AFM. By using KPFM the contact potential difference was measured on dielectric layers PSG, SiOX, SiNX and Al2O3 and on selective emitter structures. All experiments described in this work were carried out at the Solartec Ltd. workplace and they completely correspond with the actual technology of crystalline solar cells production.
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Local flood early warning system
Svoboda, Luděk ; Špaček, Jiří (referee) ; Růžek, Václav (advisor)
The aim of this Master's thesis is to design a local flood warning system. The system consists of two basic types of units. The first unit is placed in the field usingsensors and evaluates the presence of water in an otherwise dry area. In the event of flooding sends a warning message using wireless technology. The second unit evaluates the warning messages and informs the personabout the situation via text messaging. Outdoor equipment is fullyautonomous and permanently placed in an outdoor environment. The system is designed based 8-bit microcontrollers. The main parametersinclude low power devices, mechanical durability and reliability.
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