National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
The measurement of electrical properties of silicon nanostructures with use of atomic force microscopy
Hývl, M. ; Fejfar, Antonín ; Vetushka, Aliaksi
Atomic force microscopy (AFM) can be used to measure local surface potential or local conductivity. These properties are very useful to characterize photovoltaic silicon nanostructures, such as polycrystalline silicon or silicon nanorods. In this article, we demonstrate these methods and show the results of our measurements.

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