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Surface contamination of optical elements studied by Low Energy Ion Scattering LEIS
Sekula, Filip ; Kolíbal, Miroslav (referee) ; Průša, Stanislav (advisor)
This thesis focuses on study of surface contamination of optical elements using the low energy ion scattering method, LEIS. Presence of surface contaminations on optical elements has a negative contribution on thin layers that are applied upon them. The contamination can occur between the steps of manufacturing process. By determining the composition of the contaminations it could be possible to increase effectiveness during the growth of thin layers. Measurement is realised on right angle prisms at room temperature. We also focus on construction of sample holder that would allow heating of samples in the preparation chamber. Later we measure reference spectra for quantification of surface contamination.
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Design of a sample holder with electrical contacts for UHV SEM/SPM
Krutil, Vojtěch ; Vlček, Ivan (referee) ; Urban, Pavel (advisor)
The presented thesis focuses on designing a sample holder for an UHV SEM/SPM microscope suitable for using in low temperature (20 K - 300 K) applications. This newly designed sample holder is equipped with ten spring-loaded contacts for electrical connection of a transport pallet to the sample holder, which will be equipped with a temperature sensor and a heating element. Two quadruples of contacts are reserved for the sample and the temperature sensor and the remaining pair for the heating element. A thorough research study of commercially available sample holders indicates that the holders for the intended use are not available on the market. In the low-temperature tests of the newly designed sample holder, the limit temperature of the 24 K was reached in a test vacuum chamber with a flow cooling system. The ambient temperature was 300 K. The contact function was successfully verified by measuring the transient electrical resistance at the fixed and the spring contact sections. Additionally, a modification of the sample holder for high temperature (300 K - 700 K) was suggested.
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Optimization of UHV SEM for nanostructure study in wide temperature range
Axman, Tomáš ; Zigo,, Juraj (referee) ; Bábor, Petr (advisor)
This diploma thesis deals with the optimization of ultra-high vacuum scanning electron microscope - UHV SEM, which is developed within the Amispec project in cooperation with BUT, Institute of Scientific Instruments of the Czech Academy of Science and Tescan Brno, s.r.o. The theoretical part deals with the description of the actual state of the developed equipment and the research of competing systems. The next part describes the optimization of the sample holder and the pallet receptor for studying nanostructures over a wide range of temperatures. Part of the optimization is the sapphire thermal diode development and experimental verification of the functionality of the designed components. This is followed by the verification of the functionality of the whole system for the transport of samples to the UHV area, deposition with effusion cell and in-situ observations.
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Development of the sample holder for electrical diagnostics in UHV SEM
Axman, Tomáš ; Pavera, Michal (referee) ; Bábor, Petr (advisor)
This bachelor thesis focuses on design and testing of a sample holder enabling for cooling and heating of the sample in ultra-high vacuum apparatus for scanning electron microscope, developed in cooperation with Tescan company. In the theoretical part the currently used sample holders in similar UHV systems are described and their positives and negatives are discussed including material selection. The experimental part describes designing of the sample holder with respect to the required number of electrical contacts for measuring electrical properties of the samples and UHV compatibility. Measurement and testing of the manufactured sample at low and high temperatures is presented.
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