National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Microcode-controlled RAM BIST
Vykydal, Lukáš ; Kovalský, Jan (referee) ; Kubíček, Michal (advisor)
The goal of this work is to understand types of defects in semiconductor memories and algorithms for their testing. In the second part the work describes design and implementation of programmable BIST controller with small digital block size requirments.
Microcode-controlled RAM BIST
Vykydal, Lukáš ; Kovalský, Jan (referee) ; Kubíček, Michal (advisor)
The goal of this work is to understand types of defects in semiconductor memories and algorithms for their testing. In the second part the work describes design and implementation of programmable BIST controller with small digital block size requirments.

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