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National Repository of Grey Literature 1 records found  Search took 0.02 seconds. 
Rastrovací elektronová mikroskopie pomalými elektrony
 Hrnčiřík, Petr ; Müllerová, Ilona
The largest sample thickness usable for transmission electron microscopy (TEM) is determined by the inelastic and elastic mean free paths (IMFP and EMFP). At primary electron energies normally used for TEM (>50 keV), both the mean free paths decrease as the primary energy is lowered. Attaining a sufficient penetration through a transmission sample of a given thickness is then simply a question of using a suitably high primary energy. As the primary energy is lowered below about 100 eV, however, IMFP is predicted to stop decreasing and to begin to grow again. This opens up the exciting possibility of very low voltage TEM, with poorer resolution but greatly reduced radiation damage compared to conventional TEM
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