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Structure of submicrocrystalline materials studied by X-ray diffraction
Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee)
Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films.
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Structure of submicrocrystalline materials studied by X-ray diffraction
Matěj, Zdeněk ; Kužel, Radomír (advisor) ; Lukáš, Petr (referee) ; Čerňanský, Marian (referee)
Structure of submicrocrystalline materials was investigated by X-ray powder diffraction, mainly by modelling of widths and shapes of diffraction profiles. The diffraction method was applied to colloid gold nanoparticles, copper samples deformed by equal channel angular pressing and titanium dioxide nanoparticles prepared by various chemical routes. Dislocations and twin faults were identified in the metallic samples from characteristic broadening of diffraction lines. Densities of lattice defects were estimated from the diffraction data. Possibilities and limits of the diffraction method for characterisation of a crystallite size distribution were tested on the titanium dioxide samples. Crystallites of size in the range 3-25 nm could be well characterised. The problems were encountered only for samples with extremely broad size dispersion. Diffraction methods and a computer program were developed and tested, which can be applied also for the analysis of thin films.
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Influence of lattice defects on grain boundary self-diffusion in nickel
Rothová, Věra ; Buršík, Jiří ; Svoboda, Milan
An extremely wide spectrum of experimental results on the grain boundary (GB) self-diffusivities in nickel was published in the literature. Currently, our previously published results show a pronounced dependence of diffusivities on both purity and thermo-mechanical history. A possible reason for the large scatter of published experimental data could be a contribution arising from some crystal lattice defects other than GBs. Thus, in the present work, the impact of the selected lattice defects on diffusion processes, grain growth and twin production has been investigated. Hence, the cast and cold-rolled nickel specimens of purity grades from 99.5% to over 99.99% were selected to study the influence of the material purity and fabrication on microstructure and its evolution during thermal treatment and thereby on the mass transport properties.
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