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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Correlation of electron backscatter diffraction for elastic stress mapping
 Ondračka, Václav ; Kuběna, Ivo (referee) ; Spousta, Jiří (advisor)
Electron backscatter diffraction is a method that is well described and commonly used for orientation image mapping, including grain size estimation. The use of this method for measuring elastic deformation and rotations caused by plastic deformations is not so well decribed. This diploma thesis first describes the typical EBSD system. The information regarding the standard coordinate systems, grain orientation notation and system calibration is then used to create an open-source software for mapping elastic deformations and rotations inside a single grain or a monocrystal. This software uses data acquired during standard EBSD mapping on a commercial system.
Detailed record
Correlation of electron backscatter diffraction for elastic stress mapping
 Ondračka, Václav ; Kuběna, Ivo (referee) ; Spousta, Jiří (advisor)
Electron backscatter diffraction is a method that is well described and commonly used for orientation image mapping, including grain size estimation. The use of this method for measuring elastic deformation and rotations caused by plastic deformations is not so well decribed. This diploma thesis first describes the typical EBSD system. The information regarding the standard coordinate systems, grain orientation notation and system calibration is then used to create an open-source software for mapping elastic deformations and rotations inside a single grain or a monocrystal. This software uses data acquired during standard EBSD mapping on a commercial system.
Detailed record

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