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Uncertainty and Compatibility in Measurement
Kvapil, Josef ; Zavřel, Jiří (referee) ; Havlíková, Marie (advisor)
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses the elaboration of general measurement uncertainty processes for the measurements mentioned above using Agilent 4263B, Tesla BM507 and Tesla BM591 measurement instruments. This bachelor’s thesis describes possible sources of measurement uncertainty that might arise from the use of these measurement instruments. It also describes practical examples of resistivity and induction standard measurement projects using these measurement instruments followed by a compatibility evaluation of these measurements.
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Using of accurate capacitance bridge for inductance measurements
Uher, Miroslav ; Ševčík,, Karel (referee) ; Havlíková, Marie (advisor)
This master’s thesis is dealing with possibilities of measurement of inductance by using of accurate capacitance bridge AH 2500E. In metrology there are no appropriate devices available for accurate measurement of inductance. It can be realized by four methods. The newest one is based on T elements, it is not used for this purpose yet and it is practically investigated in CMI Brno. For its introduction to practice it is neccessary to complete computer simulations and analysis of influences affecting measurement. It is also inevitable to examine repeatability of measurement, define methodology of measurement and potential corrections of measured values.
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Adaptive System Design in a Reconfigurable Platform Using the Embedded Analog-to-Digital Converter
Zamba, Martin ; Růžička, Richard (referee) ; Dobai, Roland (advisor)
This thesis has its main subject pointed on possibilities of exploiting reconfigurable digital systems on FPGA basis in mixed signal applications. Description of reconfigurable and adaptive systems in general and summary of known architectures is presented in first part of this work. Next, possibilities of exploiting configurability of FPGAs in conjunction with XADC digital to analog converter are examined. These converters are provided in 7-series FPGAs and Zynq-7000 systems from Xilinx. Concept of exploiting XADC for inductance measurements is presented as alternative to existing solution - LDC1000 integrated circuit provided by Texas Instruments. Such system utilizing FPGA and XADC would come with a lot of benefits: better system integration, better signal processing options, possibility of constructing adaptive system with numerous sensory elements and last but not least, lower system cost. Advantages and disadvantages of such approach are analyzed in the very final part of this work and possible options for extension of this work are presented.
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Uncertainty and Compatibility in Measurement
Kvapil, Josef ; Zavřel, Jiří (referee) ; Havlíková, Marie (advisor)
This work is concerning the matter of resistor and inductance measurement uncertainty. It addresses the elaboration of general measurement uncertainty processes for the measurements mentioned above using Agilent 4263B, Tesla BM507 and Tesla BM591 measurement instruments. This bachelor’s thesis describes possible sources of measurement uncertainty that might arise from the use of these measurement instruments. It also describes practical examples of resistivity and induction standard measurement projects using these measurement instruments followed by a compatibility evaluation of these measurements.
|
|
|
Using of accurate capacitance bridge for inductance measurements
Uher, Miroslav ; Ševčík,, Karel (referee) ; Havlíková, Marie (advisor)
This master’s thesis is dealing with possibilities of measurement of inductance by using of accurate capacitance bridge AH 2500E. In metrology there are no appropriate devices available for accurate measurement of inductance. It can be realized by four methods. The newest one is based on T elements, it is not used for this purpose yet and it is practically investigated in CMI Brno. For its introduction to practice it is neccessary to complete computer simulations and analysis of influences affecting measurement. It is also inevitable to examine repeatability of measurement, define methodology of measurement and potential corrections of measured values.
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