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National Repository of Grey Literature 2 records found  Search took 0.00 seconds. 
Scanning Very Low Energy Electron Microscopy
 Müllerová, Ilona ; Hovorka, Miloš ; Mikmeková, Šárka ; Pokorná, Zuzana ; Mikmeková, Eliška ; Frank, Luděk
Recent developments in applications of the scanning very low energy electron microscopy in selected branches of materials science are reviewed. The examples include visualization of grains in conductive polycrystals including ultrafine grained metals, identification of the local crystal orientation upon reflectance of very slow electrons, transmission mode with ultrathin free-standing films including graphene, acquisition of a quantitative dopant contrast in semiconductors, and examination of thin surface coverages.
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Kontrast zrn na velmi nízkých energiích v REM
 Pokorná, Zuzana ; Frank, Luděk
When lowering energy of incident electrons to 100 eV and less, the elastic scattering becomes heavily anisotropic while the inelastic scattering progressively drops off. Energy dependence of the reflected signal becomes then specific to the crystal orientation. The experiments with the imaging of the metal polycrystals were done in the SEM equipped by the cathode lens.
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