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National Repository of Grey Literature 4 records found  Search took 0.02 seconds. 
Characterization of nanostructures by the near-field optical microscopy (SNOM)
 Pagáčová, Lenka ; Kalousek, Radek (referee) ; Škoda, David (advisor)
The bachelor theses is aimed to the characterizaton of nanostructures by scanning near-field optical microscopy (SNOM). There is a presentation of physical principles of SNOM and the description of the experimental set-up of the microscopy. The experimental part discusses the results of determination of transmission coefficient and characterizaton of the lithography structures prepared by focused ion beam etching method.
Detailed record
Local characterization of electronic devices
 Müller, Pavel ; Škarvada, Pavel (referee) ; Tománek, Pavel (advisor)
The development of micro and nanoelectronics and nanophotonics needs novel characterization techniques to ensure higher quality of designed devices. The thesis describes a use of Scanning Near-field Optical Microscopy (SNOM) in dimensional control and in local investigation of diverse physical parameters. As example of its potential, the correlation between object topography and reflection measurement of capacitors is shown.
Detailed record
Local characterization of electronic devices
 Müller, Pavel ; Škarvada, Pavel (referee) ; Tománek, Pavel (advisor)
The development of micro and nanoelectronics and nanophotonics needs novel characterization techniques to ensure higher quality of designed devices. The thesis describes a use of Scanning Near-field Optical Microscopy (SNOM) in dimensional control and in local investigation of diverse physical parameters. As example of its potential, the correlation between object topography and reflection measurement of capacitors is shown.
Detailed record
Characterization of nanostructures by the near-field optical microscopy (SNOM)
 Pagáčová, Lenka ; Kalousek, Radek (referee) ; Škoda, David (advisor)
The bachelor theses is aimed to the characterizaton of nanostructures by scanning near-field optical microscopy (SNOM). There is a presentation of physical principles of SNOM and the description of the experimental set-up of the microscopy. The experimental part discusses the results of determination of transmission coefficient and characterizaton of the lithography structures prepared by focused ion beam etching method.
Detailed record

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