|
|
Design, Fabrication and Testing of Environmental Chamber for Atomic Force Microscope and for Electronic Measurements of Nanosensors
Cahlík, Aleš ; Mach, Jindřich (referee) ; Bartošík, Miroslav (advisor)
This thesis deals with the concept of the chamber for atomic force microscope device NTegra Prima or alternatively for stand-alone measurements of nanosensors. The chamber will be used for defined modification of ambient conditions in space around measured sample. In first part, the theoretical principles of influence of ambient conditions on AFM methods are discussed. In the second chapter, the principles of graphene sensors measurements are showed. Further the reasons and requirements for designing this chamber are introduced. Main part deals with description of design. At the end the results of stress analysis and wall deflection of evacuated chamber are presented.
|
|
|
Research of advanced microscopic and lithographic AFM techniques
Vaněk, Kamil ; Černek, Ondrej (referee) ; Nováček, Zdeněk (advisor)
This bachelor’s thesis is about testing and improving the environmental chamber for atomic force microscope NTegra Prime and implementing hollow probes FluidFM to this microscope. A functional implementation of hollow probes to NTegra Prima together with the ability to control the atmosphere allows us to carry out nanolithography experiments with this setup. At first, the development of hollow probes and the system FluidFM is mentioned together with properties and applications. In next chapter, the AFM setup and environmental chamber is introduced. Testing of the chamber is described and enhancements presented. Next, the results of measurements in vacuum are mentioned. At the end, the implementation of hollow probes together with measurements are presented. These results are compares with measurement results with normal probe.
|
|
|
Research of advanced microscopic and lithographic AFM techniques
Vaněk, Kamil ; Černek, Ondrej (referee) ; Nováček, Zdeněk (advisor)
This bachelor’s thesis is about testing and improving the environmental chamber for atomic force microscope NTegra Prime and implementing hollow probes FluidFM to this microscope. A functional implementation of hollow probes to NTegra Prima together with the ability to control the atmosphere allows us to carry out nanolithography experiments with this setup. At first, the development of hollow probes and the system FluidFM is mentioned together with properties and applications. In next chapter, the AFM setup and environmental chamber is introduced. Testing of the chamber is described and enhancements presented. Next, the results of measurements in vacuum are mentioned. At the end, the implementation of hollow probes together with measurements are presented. These results are compares with measurement results with normal probe.
|
|
|
Design, Fabrication and Testing of Environmental Chamber for Atomic Force Microscope and for Electronic Measurements of Nanosensors
Cahlík, Aleš ; Mach, Jindřich (referee) ; Bartošík, Miroslav (advisor)
This thesis deals with the concept of the chamber for atomic force microscope device NTegra Prima or alternatively for stand-alone measurements of nanosensors. The chamber will be used for defined modification of ambient conditions in space around measured sample. In first part, the theoretical principles of influence of ambient conditions on AFM methods are discussed. In the second chapter, the principles of graphene sensors measurements are showed. Further the reasons and requirements for designing this chamber are introduced. Main part deals with description of design. At the end the results of stress analysis and wall deflection of evacuated chamber are presented.
|
guest ::
