Home > Search Results: keywords:"beam test"
Search:
Search Tips :: Advanced Search
Search collections:
Sort by: Display results: Output format:
National Repository of Grey Literature 2 records found  Search took 0.01 seconds. 
Simulation and analysis of tests of Belle II vertex detector sensors
 Bilka, Tadeáš ; Kvasnička, Peter (advisor) ; Drásal, Zbyněk (referee)
This master thesis describes development and analysis of simulation, reconstruction and alignment for tests of Belle II vertex detector sensors as well as alignment procedure for the vertex detector itself. The first goal is to develop and test software tools which would allow analysis of sensor tests within common Belle II software framework. The second goal is to prepare the alignment chain for the vertex detector, being essential component of the detector calibration. First part of the thesis describes the Belle II experiment and its vertex detector, as well as the experimental beam test of the sensors and the common software framework. The theory behind the used alignment procedure utilizing Millepede II for alignment and General Broken Lines for track fitting is explained. Second part of the thesis then summarizes software tools developed or used and the results reached with these tools with emphasis on the alignment.
Detailed record
Vývoj křemíkového detektoru pro experiment Belle II
 Bilka, Tadeáš ; Kodyš, Peter (advisor) ; Černý, Karel (referee)
This bachelor thesis describes a simulation of the DEPFET pixel semiconductor detector. The DEPFET detector is a key part of a newly constructed Belle II particle detector being built in KEK, Japan. The simulation is made as a package for the basf2 framework, developed for the Belle II experiment. The goal of this thesis was to learn about the Belle II experiment, DEPFET pixel detector and the basf2 framework and to develop a simulation environment, depicting experimental setup at CERN's SPS accelerator in 2009. First part of this thesis describes the Belle II detector, the basf2 framework and summarizes basic information about silicon particle detectors, especially about the DEPFET technology. A task for the analysis of the data is to evaluate residuals after particle track fitting and cluster information in the pixel detector. Finally the simulation with thinned DEPFET sensor being developed for the Belle II is done.
Detailed record

Interested in being notified about new results for this query?
Subscribe to the RSS feed.
Digital Repository :: Search :: Submit :: Personalize :: Help
Powered by Invenio v1.1.2
Maintained by admin.invenio@techlib.cz
This site is also available in the following languages:
Česky  English